Testing Static Random Access Memories - Frontiers in Electronic Testing
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Published By Springer US

9781441954305, 9781475767063

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Tests for single-port and two-port SRAMs

Testing Static Random Access Memories - Frontiers in Electronic Testing ◽

10.1007/978-1-4757-6706-3_6 ◽

2004 ◽

pp. 105-134

Author(s):

Said Hamdioui

Keyword(s):

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Semiconductor memory architecture

Testing Static Random Access Memories - Frontiers in Electronic Testing ◽

10.1007/978-1-4757-6706-3_2 ◽

2004 ◽

pp. 17-35

Author(s):

Said Hamdioui

Keyword(s):

Memory Architecture ◽

Semiconductor Memory

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Experimental analysis of p-port SRAMs

Testing Static Random Access Memories - Frontiers in Electronic Testing ◽

10.1007/978-1-4757-6706-3_8 ◽

2004 ◽

pp. 149-160

Author(s):

Said Hamdioui

Keyword(s):

Experimental Analysis

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Experimental analysis of two-port SRAMs

Testing Static Random Access Memories - Frontiers in Electronic Testing ◽

10.1007/978-1-4757-6706-3_5 ◽

2004 ◽

pp. 87-103

Author(s):

Said Hamdioui

Keyword(s):

Experimental Analysis

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Preparation for circuit simulation

Testing Static Random Access Memories - Frontiers in Electronic Testing ◽

10.1007/978-1-4757-6706-3_4 ◽

2004 ◽

pp. 65-84

Author(s):

Said Hamdioui

Keyword(s):

Circuit Simulation

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Trends in embedded memory testing

Testing Static Random Access Memories - Frontiers in Electronic Testing ◽

10.1007/978-1-4757-6706-3_11 ◽

2004 ◽

pp. 185-196

Author(s):

Said Hamdioui

Keyword(s):

Memory Testing ◽

Embedded Memory

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Testing restricted p-port SRAMs

Testing Static Random Access Memories - Frontiers in Electronic Testing ◽

10.1007/978-1-4757-6706-3_10 ◽

2004 ◽

pp. 175-184

Author(s):

Said Hamdioui

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Introduction

Testing Static Random Access Memories - Frontiers in Electronic Testing ◽

10.1007/978-1-4757-6706-3_1 ◽

2004 ◽

pp. 3-15

Author(s):

Said Hamdioui

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Testing restricted two-port SRAMs

Testing Static Random Access Memories - Frontiers in Electronic Testing ◽

10.1007/978-1-4757-6706-3_7 ◽

2004 ◽

pp. 135-145

Author(s):

Said Hamdioui

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Space of memory faults

Testing Static Random Access Memories - Frontiers in Electronic Testing ◽

10.1007/978-1-4757-6706-3_3 ◽

2004 ◽

pp. 37-64

Author(s):

Said Hamdioui

Keyword(s):

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