2016 IEEE 25th Asian Test Symposium (ATS)
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84
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Published By IEEE

9781509038091
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

A Neural-Network-Based Fault Classifier

2016 ◽  
Author(s):  
Laura Rodriguez Gomez ◽  
Hans-Joachim Wunderlich
Keyword(s):  
Neural Network

Sponsors

2016 ◽  

Copyright Page

2016 ◽  

scholarly journals Test Time Minimization in Reconfigurable Scan Networks

2016 ◽  
Author(s):  
Riccardo Cantoro ◽  
Marco Palena ◽  
Paolo Pasini ◽  
Matteo Sonza Reorda
Keyword(s):  
Test Time ◽  
Time Minimization

Model-Free Testing of Analog Circuits

2016 ◽  
Author(s):  
Mehrdad Heydarzadeh ◽  
Hao Luo ◽  
Mehrdad Nourani
Keyword(s):  
Analog Circuits ◽  
Model Free

A Flexible Power Control Method for Right Power Testing of Scan-Based Logic BIST

2016 ◽  
Author(s):  
Takaaki Kato ◽  
Senling Wang ◽  
Yasuo Sato ◽  
Seiji Kajihara ◽  
Xiaoqing Wen
Keyword(s):  
Power Control ◽  
Control Method ◽  
Logic Bist ◽  
Power Testing

Multi-configuration Scan Structure for Various Purposes

2016 ◽  
Author(s):  
Hiroyuki Iwata ◽  
Jun Matsushima

Critical-Area-Aware Test Pattern Generation and Reordering

2016 ◽  
Author(s):  
Shingo Inuyama ◽  
Masayuki Arai ◽  
Kazuhiko Iwasaki
Keyword(s):  
Test Pattern ◽  
Pattern Generation ◽  
Test Pattern Generation ◽  
Critical Area
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