2006 IEEE International Test Conference
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159
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H-INDEX

16
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Published By IEEE

1424402913, 1424402921
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

At-Speed Structural Test For High-Performance ASICs

2006 ◽  
Author(s):  
Vikram Iyengar ◽  
Toshihiko Yokota ◽  
Kazuhiro Yamada ◽  
Theo Anemikos ◽  
Bob Bassett ◽  
...  
Keyword(s):  
High Performance ◽  
Structural Test

Test Structure and Testing of the Microsoft XBOX 360¿ Processor High Speed Front Side Bus

2006 ◽  
Author(s):  
Tung Pham ◽  
Brian Koehler ◽  
Daniel Young ◽  
Louis Bushard
Keyword(s):  
High Speed ◽  
Test Structure ◽  
Front Side

scholarly journals Seamless Integration of SER in Rewiring-Based Design Space Exploration

2006 ◽  
Author(s):  
Sobeeh Almukhaizim ◽  
Yiorgos Makris ◽  
Yu-shen Yang ◽  
Andreas Veneris
Keyword(s):  
Design Space Exploration ◽  
Design Space ◽  
Space Exploration ◽  
Seamless Integration

Multi-Gigahertz Testing of Wafer-Level Packaged Devices

2006 ◽  
Author(s):  
A. Majid ◽  
D.C. Keezer ◽  
J. Jayabalan ◽  
M. Rotaru
Keyword(s):  
Wafer Level

DRAM-Specific Space of Memory Tests

2006 ◽  
Author(s):  
Zaid Al-Ars ◽  
Said Hamdioui ◽  
Ad van de Goor ◽  
Georgi Gaydadjiev ◽  
Joerg Vollrath
Keyword(s):  
Memory Tests

On-chip Test and Repair of Memories for Static and Dynamic Faults

2006 ◽  
Author(s):  
Sanjay Thakur ◽  
Rubin Parekhji ◽  
A. Chandorkar
Keyword(s):  
Dynamic Faults ◽  
On Chip
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