33rd IEEE International Reliability Physics Symposium
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116
(FIVE YEARS 0)

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Published By IEEE

078032031x
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

An Accelerated Sodium Resistance Test for IC Passivation Films

1995 ◽  
Author(s):  
Charlie Hong ◽  
Brent Henson ◽  
Tony Scelsi ◽  
Robert Hance
Keyword(s):  
Resistance Test

Design Rules for a Reliable Surface Micromachined IC Sensor

1995 ◽  
Author(s):  
S. Bart ◽  
J. Chang ◽  
T. Core ◽  
L. Foster ◽  
A. Olney ◽  
...  
Keyword(s):  
Design Rules

Analysis and optimisation of the hot-carrier degradation performance of 0.35-¿m fully overlapped LDD devices

1995 ◽  
Author(s):  
R. Bellens ◽  
P. Habas ◽  
G. Groeseneken ◽  
H.E. Maes ◽  
J.P. Mieville ◽  
...  
Keyword(s):  
Hot Carrier ◽  
Hot Carrier Degradation

Relation Between Etch Pit Pairs And Pipeline Defects In CMOS Device

1995 ◽  
Author(s):  
Sik-Han Soh ◽  
Jim Lari ◽  
Scott Hunt ◽  
Tad Davies ◽  
Max Kuo ◽  
...  
Keyword(s):  
Etch Pit

Enhancement and Degradation of Drain Current in Pseudomorphic AlGaAs/InGaAs HEMT's Induced by Hot-Electrons

1995 ◽  
Author(s):  
Claudio Canali ◽  
Paolo Cova ◽  
Eros De Bortoli ◽  
Fausto Fantini ◽  
Gaudenzio Meneghesso ◽  
...  
Keyword(s):  
Drain Current ◽  
Hot Electrons

TDDB Characterisation Of Thin SiO2 Films With Bimodal Failure Populations

1995 ◽  
Author(s):  
James Prendergast ◽  
John Suehle ◽  
Prasad Chaparala ◽  
Bammon Murphy ◽  
Malcom Stephenson
Keyword(s):  
Sio2 Films
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