2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
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The Future of Test -- Product Integration and its Impact on Test

2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems ◽

10.1109/dft.2009.67 ◽

2009 ◽

Author(s):

Michael Campbell

Keyword(s):

Product Integration ◽

Test Product ◽

The Future

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Copyright Page

2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems ◽

10.1109/dft.2009.3 ◽

2009 ◽

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Error Correction Codes for SEU and SEFI Tolerant Memory Systems

2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems ◽

10.1109/dft.2009.8 ◽

2009 ◽

Cited By ~ 4

Author(s):

S. Pontarelli ◽

G.C. Cardarilli ◽

M. Re ◽

A. Salsano

Keyword(s):

Error Correction ◽

Memory Systems ◽

Error Correction Codes

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Defect-Tolerant Logic Mapping on Nanoscale Crossbar Architectures and Yield Analysis

2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems ◽

10.1109/dft.2009.16 ◽

2009 ◽

Cited By ~ 15

Author(s):

Yehua Su ◽

Wenjing Rao

Keyword(s):

Yield Analysis

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Improving the Detectability of Resistive Open Faults in Scan Cells

2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems ◽

10.1109/dft.2009.30 ◽

2009 ◽

Cited By ~ 8

Author(s):

Fan Yang ◽

Sreejit Chakravarty ◽

Narendra Devta-Prasanna ◽

Sudhakar M. Reddy ◽

Irith Pomeranz

Keyword(s):

Open Faults

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Low DPM: Why Do We Need it and What Does it Cost!

2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems ◽

10.1109/dft.2009.66 ◽

2009 ◽

Author(s):

Sandeep P. Kumar

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A Fault Analysis and Classifier Framework for Reliability-Aware SRAM-Based FPGA Systems

2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems ◽

10.1109/dft.2009.10 ◽

2009 ◽

Cited By ~ 8

Author(s):

Cristiana Bolchini ◽

Fabrizio Castro ◽

Antonio Miele

Keyword(s):

Fault Analysis

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Optimization of Nanoelectronic Systems Reliability Under Massive Defect Density Using Distributed R-fold Modular Redundancy (DRMR)

2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems ◽

10.1109/dft.2009.54 ◽

2009 ◽

Cited By ~ 8

Author(s):

Milos Stanisavljevic ◽

Alexandre Schmid ◽

Yusuf Leblebici

Keyword(s):

Defect Density ◽

Modular Redundancy

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Improving the Effectiveness of XOR-based Decompressors through Horizontal/Vertical Move of Stimulus Fragments

2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems ◽

10.1109/dft.2009.9 ◽

2009 ◽

Cited By ~ 3

Author(s):

Nader Alawadhi ◽

Ozgur Sinanoglu

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Title Page i

2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems ◽

10.1109/dft.2009.1 ◽

2009 ◽

Keyword(s):

Title Page

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2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI SystemsLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

The Future of Test -- Product Integration and its Impact on Test

Copyright Page

Error Correction Codes for SEU and SEFI Tolerant Memory Systems

Defect-Tolerant Logic Mapping on Nanoscale Crossbar Architectures and Yield Analysis

Improving the Detectability of Resistive Open Faults in Scan Cells

Low DPM: Why Do We Need it and What Does it Cost!

A Fault Analysis and Classifier Framework for Reliability-Aware SRAM-Based FPGA Systems

Optimization of Nanoelectronic Systems Reliability Under Massive Defect Density Using Distributed R-fold Modular Redundancy (DRMR)

Improving the Effectiveness of XOR-based Decompressors through Horizontal/Vertical Move of Stimulus Fragments

Title Page i

2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
Latest Publications