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2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
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68
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Copyright Page
2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
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10.1109/dft.2009.3
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2009
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Error Correction Codes for SEU and SEFI Tolerant Memory Systems
2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
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10.1109/dft.2009.8
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2009
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Cited By ~ 4
Author(s):
S. Pontarelli
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G.C. Cardarilli
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M. Re
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A. Salsano
Keyword(s):
Error Correction
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Memory Systems
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Error Correction Codes
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Defect-Tolerant Logic Mapping on Nanoscale Crossbar Architectures and Yield Analysis
2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
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10.1109/dft.2009.16
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2009
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Cited By ~ 15
Author(s):
Yehua Su
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Wenjing Rao
Keyword(s):
Yield Analysis
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The Future of Test -- Product Integration and its Impact on Test
2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
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10.1109/dft.2009.67
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2009
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Author(s):
Michael Campbell
Keyword(s):
Product Integration
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Test Product
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The Future
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Improving the Effectiveness of XOR-based Decompressors through Horizontal/Vertical Move of Stimulus Fragments
2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
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10.1109/dft.2009.9
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2009
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Cited By ~ 3
Author(s):
Nader Alawadhi
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Ozgur Sinanoglu
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Title Page i
2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
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10.1109/dft.2009.1
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2009
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Keyword(s):
Title Page
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Workload-Cognizant Impact Analysis and its Applications in Error Detection and Tolerance in Modern Microprocessors
2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
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10.1109/dft.2009.64
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2009
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Author(s):
Yiorgos Makris
Keyword(s):
Error Detection
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Impact Analysis
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Improving the Detectability of Resistive Open Faults in Scan Cells
2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
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10.1109/dft.2009.30
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2009
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Cited By ~ 8
Author(s):
Fan Yang
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Sreejit Chakravarty
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Narendra Devta-Prasanna
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Sudhakar M. Reddy
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Irith Pomeranz
Keyword(s):
Open Faults
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Low DPM: Why Do We Need it and What Does it Cost!
2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
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10.1109/dft.2009.66
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2009
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Author(s):
Sandeep P. Kumar
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A Fault Analysis and Classifier Framework for Reliability-Aware SRAM-Based FPGA Systems
2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
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10.1109/dft.2009.10
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2009
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Cited By ~ 8
Author(s):
Cristiana Bolchini
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Fabrizio Castro
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Antonio Miele
Keyword(s):
Fault Analysis
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