Nanoscale CMOS
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Published By John Wiley & Sons, Inc.

9781118621523, 9781848211803
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Wide Frequency Band Characterization

2013 ◽  
pp. 603-638
Author(s):  
D. Flandre ◽  
J.-p. Raskin ◽  
V. Kilchytska
Keyword(s):  
Frequency Band ◽  
Wide Frequency Band

Strain Determination

2013 ◽  
pp. 575-601
Author(s):  
A. O'Neill ◽  
S. Olsen ◽  
P. Dobrosz ◽  
R. Agaiby ◽  
Y. Tsang
Keyword(s):  
Strain Determination

NEGF for 3D Device Simulation of Nanometric Inhomogenities

2013 ◽  
pp. 335-380
Author(s):  
A. Martinez ◽  
A. Asenov ◽  
M. Pala
Keyword(s):  
Device Simulation

Modeling and Simulation Approaches for Drain Current Computation

2013 ◽  
pp. 259-285
Author(s):  
M. Vasicek ◽  
D. Esseni ◽  
C. Fiegna ◽  
T. Grasser
Keyword(s):  
Modeling And Simulation ◽  
Drain Current

Introduction to Part 2

2013 ◽  
pp. 205-212
Author(s):  
E. Sangiorgi

Strained Si and Ge Channels

2013 ◽  
pp. 69-126
Author(s):  
D. Leadley ◽  
A. Dobbie ◽  
M. Myronov ◽  
V. Shah ◽  
E. Parker
Keyword(s):  
Strained Si

Characterization of Interface Defects

2013 ◽  
pp. 545-573
Author(s):  
P. Hurley ◽  
O. Engström ◽  
D. Bauza ◽  
G. Ghibaudo
Keyword(s):  
Interface Defects

Beyond CMOS

2013 ◽  
pp. 443-470
Author(s):  
G. Iannaccone ◽  
G. Fiori ◽  
S. Reggiani ◽  
M. Pala
Keyword(s):  
Beyond Cmos
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