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Tenth IEEE International High-Level Design Validation and Test Workshop, 2005.
Latest Publications
TOTAL DOCUMENTS
47
(FIVE YEARS 0)
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5
(FIVE YEARS 0)
Published By IEEE
0780395719
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Latest Documents
Most Cited Documents
Contributed Authors
Related Sources
Related Keywords
Automated clock inference for stream function-based system level specifications
Tenth IEEE International High-Level Design Validation and Test Workshop, 2005.
◽
10.1109/hldvt.2005.1568815
◽
2006
◽
Cited By ~ 2
Author(s):
J.-P. Talpin
◽
S.K. Shukla
Keyword(s):
Stream Function
◽
System Level
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Improvement of fault injection techniques based on VHDL code modification
Tenth IEEE International High-Level Design Validation and Test Workshop, 2005.
◽
10.1109/hldvt.2005.1568808
◽
2006
◽
Cited By ~ 26
Author(s):
J.C. Baraza
◽
J. Gracia
◽
D. Gil
◽
P.J. Gil
Keyword(s):
Fault Injection
◽
Injection Techniques
◽
Vhdl Code
◽
Code Modification
Download Full-text
Sequential equivalence checking based on k-th invariants and circuit SAT solving
Tenth IEEE International High-Level Design Validation and Test Workshop, 2005.
◽
10.1109/hldvt.2005.1568812
◽
2006
◽
Cited By ~ 9
Author(s):
F. Lu
◽
K.-T. Cheng
Keyword(s):
Equivalence Checking
◽
Sat Solving
◽
Sequential Equivalence Checking
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Scalable defect mapping and configuration of memory-based nanofabrics
Tenth IEEE International High-Level Design Validation and Test Workshop, 2005.
◽
10.1109/hldvt.2005.1568807
◽
2006
◽
Cited By ~ 3
Author(s):
Chen He
◽
M.F. Jacome
◽
G. de Veciana
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Formal verification of high-level conformance with symbolic simulation
Tenth IEEE International High-Level Design Validation and Test Workshop, 2005.
◽
10.1109/hldvt.2005.1568830
◽
2006
◽
Cited By ~ 1
Author(s):
R. Kaivola
◽
A. Naik
Keyword(s):
Formal Verification
◽
Symbolic Simulation
◽
High Level
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Simulation-based functional test generation for embedded processors
Tenth IEEE International High-Level Design Validation and Test Workshop, 2005.
◽
10.1109/hldvt.2005.1568806
◽
2006
◽
Cited By ~ 1
Author(s):
C.H.-P. Wen
◽
L.-C. Wang
◽
Kwang-Ting Cheng
Keyword(s):
Test Generation
◽
Functional Test
◽
Embedded Processors
◽
Simulation Based
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Stimulus generation for interface protocol verification using the non-deterministic extended finite state machine model
Tenth IEEE International High-Level Design Validation and Test Workshop, 2005.
◽
10.1109/hldvt.2005.1568819
◽
2006
◽
Cited By ~ 4
Author(s):
Che-Hua Shih
◽
Juinn-Dar Huang
◽
Jing-Yang Jou
Keyword(s):
Finite State Machine
◽
State Machine
◽
Protocol Verification
◽
Machine Model
◽
Finite State
◽
Stimulus Generation
◽
Extended Finite State Machine
◽
Interface Protocol
Download Full-text
Advanced analysis techniques for cross-product coverage
Tenth IEEE International High-Level Design Validation and Test Workshop, 2005.
◽
10.1109/hldvt.2005.1568842
◽
2006
◽
Cited By ~ 1
Author(s):
H. Azatchi
◽
L. Fournier
◽
A. Ziv
◽
K. Zohar
Keyword(s):
Cross Product
◽
Analysis Techniques
◽
Advanced Analysis
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Cosimulation of ITRON-based embedded software with systemc
Tenth IEEE International High-Level Design Validation and Test Workshop, 2005.
◽
10.1109/hldvt.2005.1568816
◽
2006
◽
Cited By ~ 2
Author(s):
S. Chikada
◽
S. Honda
◽
H. Tomiyama
◽
H. Takada
Keyword(s):
Embedded Software
Download Full-text
Security evaluation against electromagnetic analysis at design time
Tenth IEEE International High-Level Design Validation and Test Workshop, 2005.
◽
10.1109/hldvt.2005.1568839
◽
2006
◽
Cited By ~ 5
Author(s):
Huiyun Li
◽
A.T. Markettos
◽
S. Moore
Keyword(s):
Security Evaluation
◽
Electromagnetic Analysis
◽
Design Time
Download Full-text
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