2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS)
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scholarly journals Machine Learning Clustering Techniques for Selective Mitigation of Critical Design Features

2020 ◽  
Author(s):  
Thomas Lange ◽  
Aneesh Balakrishnan ◽  
Maximilien Glorieux ◽  
Dan Alexandrescu ◽  
Luca Sterpone
Keyword(s):  
Machine Learning ◽  
Design Features ◽  
Clustering Techniques ◽  
Critical Design

Automatic Fault Simulators for Diagnosis of Analog Systems

2020 ◽  
Author(s):  
Tommaso Melis ◽  
Emmanuel Simeu ◽  
Etienne Auvray
Keyword(s):  
Analog Systems

scholarly journals Yield Estimation of a Memristive Sensor Array

2020 ◽  
Author(s):  
Vishal Gupta ◽  
Saurabh Khandelwal ◽  
Giulio Panunzi ◽  
Eugenio Martinelli ◽  
Said Hamdioui ◽  
...  
Keyword(s):  
Sensor Array ◽  
Yield Estimation

A Test Sensitization State Compaction Method on Controller Augmentation

2020 ◽  
Author(s):  
Yuki Ikegaya ◽  
Toshinori Hosokawa ◽  
Yuta Ishiyama ◽  
Hiroshi Yamazaki
Keyword(s):  
Compaction Method
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