2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)
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Published By IEEE

9781479919994

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On the limitations of logic testing for detecting Hardware Trojans Horses

2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) ◽

10.1109/dtis.2015.7127362 ◽

2015 ◽

Cited By ~ 7

Author(s):

Marie-Lise Flottes ◽

Sophie Dupuis ◽

Papa-Sidy Ba ◽

Bruno Rouzeyre

Keyword(s):

Hardware Trojans ◽

Logic Testing

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Electronics and computing in nano-era: The good, the bad and the challenging

2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) ◽

10.1109/dtis.2015.7127342 ◽

2015 ◽

Cited By ~ 1

Author(s):

Said Hamdioui

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Supply voltage variation impact on Anderson PUF quality

2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) ◽

10.1109/dtis.2015.7127361 ◽

2015 ◽

Cited By ~ 4

Author(s):

Mario Barbareschi ◽

Pierpaolo Bagnasco ◽

Antonino Mazzeo

Keyword(s):

Supply Voltage ◽

Voltage Variation

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Multi-valued logic test access mechanism for test time and power reduction

2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) ◽

10.1109/dtis.2015.7127351 ◽

2015 ◽

Cited By ~ 2

Author(s):

Amirreza Nekooei ◽

Zainalabedin Navabi

Keyword(s):

Power Reduction ◽

Test Time ◽

Test Access Mechanism

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Variable Gain Amplifier in CMOS 0.18µm for WiMAX application

2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) ◽

10.1109/dtis.2015.7127345 ◽

2015 ◽

Author(s):

Sawssen Lahiani ◽

Dorra Ayadi ◽

Samir Ben Salem ◽

Skandar Douss ◽

Mourad Loulou

Keyword(s):

Variable Gain Amplifier ◽

Variable Gain

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2T2M memristor based TCAM cell for low power applications

2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) ◽

10.1109/dtis.2015.7127379 ◽

2015 ◽

Cited By ~ 3

Author(s):

Yuanfan Yang ◽

Jimson Mathew ◽

Marco Ottavi ◽

Salvatore Pontarelli ◽

Dhiraj K Pradhan

Keyword(s):

Low Power

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Scan-chain intra-cell defects grading

2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) ◽

10.1109/dtis.2015.7127349 ◽

2015 ◽

Cited By ~ 1

Author(s):

A. Touati ◽

A. Bosio ◽

L. Dilillo ◽

P. Girard ◽

A. Virazel ◽

...

Keyword(s):

Scan Chain

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Analog circuits testing using digitally coded indirect measurements

2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) ◽

10.1109/dtis.2015.7127357 ◽

2015 ◽

Cited By ~ 1

Author(s):

Alvaro Gomez-Pau ◽

Luz Balado ◽

Joan Figueras

Keyword(s):

Analog Circuits ◽

Indirect Measurements

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A digital pseudorandom uniform noise generator for ADC built-in self-test

2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) ◽

10.1109/dtis.2015.7127358 ◽

2015 ◽

Cited By ~ 3

Author(s):

Jose Domingos Alves ◽

Guiomar Evans

Keyword(s):

Noise Generator ◽

Uniform Noise ◽

Self Test ◽

Built In Self Test

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Application-specific power-aware mapping for reconfigurable NoC architectures

2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) ◽

10.1109/dtis.2015.7127381 ◽

2015 ◽

Author(s):

Mehran Goli ◽

Amin Ghasemazar ◽

Zainalabedin Navabi

Keyword(s):

Specific Power ◽

Application Specific

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2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

On the limitations of logic testing for detecting Hardware Trojans Horses

Electronics and computing in nano-era: The good, the bad and the challenging

Supply voltage variation impact on Anderson PUF quality

Multi-valued logic test access mechanism for test time and power reduction

Variable Gain Amplifier in CMOS 0.18µm for WiMAX application

2T2M memristor based TCAM cell for low power applications

Scan-chain intra-cell defects grading

Analog circuits testing using digitally coded indirect measurements

A digital pseudorandom uniform noise generator for ADC built-in self-test

Application-specific power-aware mapping for reconfigurable NoC architectures

2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)
Latest Publications