2020 IEEE International Test Conference (ITC)
Latest Publications

TOTAL DOCUMENTS

73
(FIVE YEARS 0)

H-INDEX

0
(FIVE YEARS 0)

Published By IEEE

9781728191133
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Test and Diagnosis Solution for Functional Safety

2020 ◽  
Author(s):  
M. Casarsa ◽  
G. Harutyunyan ◽  
Y. Zorian
Keyword(s):  
Functional Safety

Logic Fault Diagnosis of Hidden Delay Defects

2020 ◽  
Author(s):  
Stefan Holst ◽  
Matthias Kampmann ◽  
Alexander Sprenger ◽  
Jan Dennis Reimer ◽  
Sybille Hellebrand ◽  
...  
Keyword(s):  
Fault Diagnosis ◽  
Delay Defects

Hardware IP Protection Using Logic Encryption and Watermarking

2020 ◽  
Author(s):  
Rajit Karmakar ◽  
Santanu Chattopadhyay
Keyword(s):  
Ip Protection

Memory repair logic sharing techniques and their impact on yield

2020 ◽  
Author(s):  
Benoit Nadeau-Dostie ◽  
Luc Romain
Keyword(s):  
Memory Repair

Machine Intelligence for Efficient Test Pattern Generation

2020 ◽  
Author(s):  
Soham Roy ◽  
Spencer K. Millican ◽  
Vishwani D. Agrawal
Keyword(s):  
Test Pattern ◽  
Pattern Generation ◽  
Machine Intelligence ◽  
Test Pattern Generation ◽  
Efficient Test

Security Preserving Integration and Resynthesis of Reconfigurable Scan Networks

2020 ◽  
Author(s):  
Natalia Lylina ◽  
Ahmed Atteya ◽  
Chih-Hao Wang ◽  
Hans-Joachim Wunderlich

Quick Analyses for Improving Reliability and Functional Safety of Mixed-Signal ICs

2020 ◽  
Author(s):  
Stephen Sunter ◽  
Michal Wolinski ◽  
Anthony Coyette ◽  
Ronny Vanhooren ◽  
Wim Dobbelaere ◽  
...  
Keyword(s):  
Functional Safety ◽  
Mixed Signal

Fail Memory Configuration Set for RA Estimation

2020 ◽  
Author(s):  
Hayoung Lee ◽  
Keewon Cho ◽  
Sungho Kang ◽  
Wooheon Kang ◽  
Seungtaek Lee ◽  
...  

qATG: Automatic Test Generation for Quantum Circuits

2020 ◽  
Author(s):  
Chen-Hung Wu ◽  
Cheng-Yun Hsieh ◽  
Jiun-Yun Li ◽  
James Chien-Mo Li
Keyword(s):  
Test Generation ◽  
Quantum Circuits ◽  
Automatic Test Generation ◽  
Automatic Test
Load More ...
Sign in / Sign up

Export Citation Format

Share Document