19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings.
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Error-resilient test data compression using Tunstall codes

19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. ◽

10.1109/dft.2004.27 ◽

2005 ◽

Cited By ~ 1

Author(s):

H. Hashempour ◽

L. Schiano ◽

F. Lombardi

Keyword(s):

Data Compression ◽

Test Data ◽

Test Data Compression ◽

Error Resilient

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System-level dependability analysis with RT-level fault injection accuracy

19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. ◽

10.1109/dftvs.2004.1347870 ◽

2004 ◽

Cited By ~ 7

Author(s):

R. Leveugle ◽

D. Cimonnet ◽

A. Ammari

Keyword(s):

Fault Injection ◽

System Level ◽

Dependability Analysis

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At-speed functional verification of programmable devices

19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. ◽

10.1109/dftvs.2004.1347863 ◽

2004 ◽

Author(s):

N. Bombieri ◽

F. Fummi ◽

G. Pravadelli

Keyword(s):

Functional Verification ◽

Programmable Devices

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Failure factor based yield enhancement for SRAM designs

19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. ◽

10.1109/dftvs.2004.1347821 ◽

2004 ◽

Cited By ~ 6

Author(s):

Yu-Tsao Hsing ◽

Chih-Wea Wang ◽

Ching-Wei Wu

Keyword(s):

Yield Enhancement

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Defect avoidance in a 3-D heterogeneous sensor

19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. ◽

10.1109/dftvs.2004.1347826 ◽

2004 ◽

Cited By ~ 9

Author(s):

G.H. Chapman ◽

V. Jain ◽

S. Bhansali

Keyword(s):

Defect Avoidance

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Data integrity evaluations of reed solomon codes for storage systems

19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. ◽

10.1109/dftvs.2004.1347836 ◽

2004 ◽

Cited By ~ 10

Author(s):

G.C. Cardarilli ◽

M. Ottavi ◽

S. Pontarelli ◽

M. Re ◽

A. Salsano

Keyword(s):

Storage Systems ◽

Data Integrity ◽

Reed Solomon Codes

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On the yield of compiler-based eSRAMs

19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. ◽

10.1109/dftvs.2004.1347820 ◽

2004 ◽

Cited By ~ 8

Author(s):

X. Wang ◽

M. Ottavi ◽

F. Meyer ◽

F. Lombardi

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Fault diagnosis of analog circuits by operation-region model and X-Y zoning method

19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. ◽

10.1109/dftvs.2004.1347844 ◽

2004 ◽

Cited By ~ 5

Author(s):

Y. Miura

Keyword(s):

Fault Diagnosis ◽

Analog Circuits ◽

Region Model

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Characteristics of fault-tolerant photodiode and photogate active pixel sensor (APS)

19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. ◽

10.1109/dftvs.2004.1347825 ◽

2004 ◽

Cited By ~ 2

Author(s):

M.L. La Haye ◽

G.H. Chapman ◽

C. Jung ◽

Y. Audet

Keyword(s):

Fault Tolerant ◽

Active Pixel Sensor ◽

Active Pixel

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Monitoring methodology for TID damaging of SDRAM devices based on retention time analysis

19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. ◽

10.1109/dftvs.2004.1347830 ◽

2004 ◽

Cited By ~ 4

Author(s):

S. Bertazzoni ◽

D. Di Giovenale ◽

M. Salmeri ◽

A. Mencattini ◽

A. Salsano ◽

...

Keyword(s):

Retention Time ◽

Time Analysis

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19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings.Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Error-resilient test data compression using Tunstall codes

System-level dependability analysis with RT-level fault injection accuracy

At-speed functional verification of programmable devices

Failure factor based yield enhancement for SRAM designs

Defect avoidance in a 3-D heterogeneous sensor

Data integrity evaluations of reed solomon codes for storage systems

On the yield of compiler-based eSRAMs

Fault diagnosis of analog circuits by operation-region model and X-Y zoning method

Characteristics of fault-tolerant photodiode and photogate active pixel sensor (APS)

Monitoring methodology for TID damaging of SDRAM devices based on retention time analysis

19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings.
Latest Publications