19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings.
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Error-resilient test data compression using Tunstall codes

19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. ◽

10.1109/dft.2004.27 ◽

2005 ◽

Author(s):

H. Hashempour ◽

L. Schiano ◽

F. Lombardi

Keyword(s):

Data Compression ◽

Test Data ◽

Test Data Compression ◽

Error Resilient

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Failure factor based yield enhancement for SRAM designs

19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. ◽

10.1109/dftvs.2004.1347821 ◽

2004 ◽

Author(s):

Yu-Tsao Hsing ◽

Chih-Wea Wang ◽

Ching-Wei Wu

Keyword(s):

Yield Enhancement

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System-level dependability analysis with RT-level fault injection accuracy

19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. ◽

10.1109/dftvs.2004.1347870 ◽

2004 ◽

Author(s):

R. Leveugle ◽

D. Cimonnet ◽

A. Ammari

Keyword(s):

Fault Injection ◽

System Level ◽

Dependability Analysis

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At-speed functional verification of programmable devices

19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. ◽

10.1109/dftvs.2004.1347863 ◽

2004 ◽

Author(s):

N. Bombieri ◽

F. Fummi ◽

G. Pravadelli

Keyword(s):

Functional Verification ◽

Programmable Devices

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On the yield of compiler-based eSRAMs

19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. ◽

10.1109/dftvs.2004.1347820 ◽

2004 ◽

Author(s):

X. Wang ◽

M. Ottavi ◽

F. Meyer ◽

F. Lombardi

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Defect avoidance in a 3-D heterogeneous sensor

19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. ◽

10.1109/dftvs.2004.1347826 ◽

2004 ◽

Author(s):

G.H. Chapman ◽

V. Jain ◽

S. Bhansali

Keyword(s):

Defect Avoidance

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Data integrity evaluations of reed solomon codes for storage systems

19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. ◽

10.1109/dftvs.2004.1347836 ◽

2004 ◽

Author(s):

G.C. Cardarilli ◽

M. Ottavi ◽

S. Pontarelli ◽

M. Re ◽

A. Salsano

Keyword(s):

Storage Systems ◽

Data Integrity ◽

Reed Solomon Codes

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Fault diagnosis of analog circuits by operation-region model and X-Y zoning method

19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. ◽

10.1109/dftvs.2004.1347844 ◽

2004 ◽

Author(s):

Y. Miura

Keyword(s):

Fault Diagnosis ◽

Analog Circuits ◽

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Transient current testing of dynamic CMOS circuits

19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. ◽

10.1109/dftvs.2004.1347848 ◽

2004 ◽

Author(s):

N. Aaraj ◽

A. Nazer ◽

A. Chehab ◽

A. Kayssi

Keyword(s):

Transient Current ◽

Cmos Circuits ◽

Current Testing

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Response compaction for test time and test pins reduction based on advanced convolutional codes

19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. ◽

10.1109/dftvs.2004.1347852 ◽

2004 ◽

Author(s):

Yinhe Han ◽

Yu Hu ◽

Huawei Li ◽

Xiaowei Li ◽

A. Chandra

Keyword(s):

Convolutional Codes ◽

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