2014 51st ACM/EDAC/IEEE Design Automation Conference (DAC)
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9781479930173
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On using implied values in EDT-based test compression

2014 ◽  
Author(s):  
Marcin Gebala ◽  
Grzegorz Mrugalski ◽  
Nilanjan Mukherjee ◽  
Janusz Rajski ◽  
Jerzy Tyszer
Keyword(s):  
Test Compression

BTI-induced aging under random stress waveforms: Modeling, simulation and silicon validation

2014 ◽  
Author(s):  
Ketul Sutaria ◽  
Athul Ramkumar ◽  
Rongjun Zhu ◽  
Renju Rajveev ◽  
Yao Ma ◽  
...  
Keyword(s):  
Modeling Simulation

PUFatt: Embedded platform attestation based on novel processor-based PUFs

2014 ◽  
Author(s):  
Joonho Kong ◽  
Farinaz Koushanfar ◽  
Praveen K. Pendyala ◽  
Ahmad-Reza Sadeghi ◽  
Christian Wachsmann
Keyword(s):  
Embedded Platform

Row based dual-VDD island generation and placement

2014 ◽  
Author(s):  
Hua Xiang ◽  
Haifeng Qian ◽  
Ching Zhou ◽  
Yu-Shiang Lin ◽  
Fanchieh Yee ◽  
...  

Protecting SRAM-based FPGAs against multiple bit upsets using erasure codes

2014 ◽  
Author(s):  
Parthasarathy M.B. Rao ◽  
Mojtaba Ebrahimi ◽  
Razi Seyyedi ◽  
Mehdi B. Tahoori
Keyword(s):  
Erasure Codes

Deterministic crash recovery for NAND flash based storage systems

2014 ◽  
Author(s):  
Chi Zhang ◽  
Yi Wang ◽  
Tianzheng Wang ◽  
Renhai Chen ◽  
Duo Liu ◽  
...  
Keyword(s):  
Storage Systems ◽  
Nand Flash ◽  
Crash Recovery
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