In Situ Characterization of Thin Film Growth
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Published By Elsevier

9781845699345
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Copyright

2011 ◽  
pp. iv

scholarly journals Index

2011 ◽  
pp. 274-282

Real-time studies of epitaxial film growth using surface X-ray diffraction (SXRD)

2011 ◽  
pp. 239-273
Author(s):  
G. Eres ◽  
J.Z. Tischler ◽  
C.M. Rouleau ◽  
B.C. Larson ◽  
H.M. Christen ◽  
...  
Keyword(s):  
Real Time ◽  
Epitaxial Film ◽  
Film Growth ◽  
X Ray Diffraction ◽  
X Ray ◽  
Epitaxial Film Growth

In situ deposition vapor monitoring

2011 ◽  
pp. 212-238 ◽  
Author(s):  
V. Matias ◽  
R.H. Hammond
Keyword(s):  
In Situ Deposition

Contributor contact details

2011 ◽  
pp. ix-xi
Author(s):  
Gertjan Koster ◽  
Guus Rijnders ◽  
Gertjan Koster ◽  
N.J.C. Ingle ◽  
Kyle M. Shen ◽  
...  

Front matter

2011 ◽  
pp. i-iii
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