2005 8th European Conference on Radiation and Its Effects on Components and Systems

New Details about the Frequency Behaviour of Irradiated Bipolar Op Amps

2005 8th European Conference on Radiation and Its Effects on Components and Systems ◽

10.1109/radecs.2005.4365601 ◽

2005 ◽

Cited By ~ 1

Author(s):

F. J. Franco ◽

Y. Zong ◽

J. A. Agapito

Keyword(s):

Op Amps

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Total dose environment in SSR component on board Tsubasa (MDS-1) Satellite

2005 8th European Conference on Radiation and Its Effects on Components and Systems ◽

10.1109/radecs.2005.4365582 ◽

2005 ◽

Author(s):

Yugo Kimoto ◽

Satoshi Ichikawa ◽

Takeshi Sasada ◽

Hideki Koshiishi ◽

Haruhisa Matsumoto ◽

...

Keyword(s):

Total Dose

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Experimental and 3D Simulation Study on the Role of the Parasitic BJT Activation in SEB/SEGR of Power MOSFET

2005 8th European Conference on Radiation and Its Effects on Components and Systems ◽

10.1109/radecs.2005.4365576 ◽

2005 ◽

Cited By ~ 5

Author(s):

A. Porzio ◽

G. Busatto ◽

F. Velardi ◽

F. Iannuzzo ◽

A. Sanseverino ◽

...

Keyword(s):

Simulation Study ◽

3D Simulation ◽

Power Mosfet

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Three-Dimensional Modeling of the Two Photon Absorption Effect in a Complex Bipolar Transistor

2005 8th European Conference on Radiation and Its Effects on Components and Systems ◽

10.1109/radecs.2005.4365575 ◽

2005 ◽

Cited By ~ 2

Author(s):

A.L. Sternberg ◽

Y. Boulghassoul ◽

L.W. Massengill ◽

D. McMorrow ◽

W.T. Lotshaw ◽

...

Keyword(s):

Three Dimensional ◽

Bipolar Transistor ◽

Photon Absorption ◽

Absorption Effect ◽

Two Photon Absorption ◽

Two Photon ◽

Three Dimensional Modeling ◽

Dimensional Modeling

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X-ray High Dose Rate Investigation of Up-to-Date Space Mission Protection Technologies

2005 8th European Conference on Radiation and Its Effects on Components and Systems ◽

10.1109/radecs.2005.4365646 ◽

2005 ◽

Cited By ~ 6

Author(s):

B. Azais ◽

Ph. Charre ◽

G. Auriel

Keyword(s):

Dose Rate ◽

Space Mission ◽

High Dose Rate ◽

High Dose ◽

X Ray

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Towards SET Mitigation in RF Digital PLLs: From Error Characterization to Radiation Hardening Considerations

2005 8th European Conference on Radiation and Its Effects on Components and Systems ◽

10.1109/radecs.2005.4365638 ◽

2005 ◽

Cited By ~ 1

Author(s):

Y. Boulghassoul ◽

L. W. Massengill ◽

A. L. Steinberg ◽

B. L. Bhuva ◽

W. T. Holman

Keyword(s):

Radiation Hardening ◽

Error Characterization

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Analysis of the Transient Response of High Performance 50-nm Partially Depleted SOI Transistors Using a Laser Probing Technique

2005 8th European Conference on Radiation and Its Effects on Components and Systems ◽

10.1109/radecs.2005.4365570 ◽

2005 ◽

Cited By ~ 2

Author(s):

V. Ferlet-Cavrois ◽

P. Paillet ◽

D. McMorrow ◽

J. S. Melinger ◽

A. B. Campbell ◽

...

Keyword(s):

Transient Response ◽

High Performance ◽

Laser Probing

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RADECS 2005 Proceedings Comments by the Guest Editor

2005 8th European Conference on Radiation and Its Effects on Components and Systems ◽

10.1109/radecs.2005.4365545 ◽

2005 ◽

Author(s):

Jean-Luc Autran

Keyword(s):

Guest Editor

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TID and SEE characterization and damaging analysis of 256 Mbit COTS SDRAM for IEEM application

2005 8th European Conference on Radiation and Its Effects on Components and Systems ◽

10.1109/radecs.2005.4365652 ◽

2005 ◽

Cited By ~ 1

Author(s):

Stefano Bertazzoni ◽

Domenico Di Giovenale ◽

Lorenzo Mongiardo ◽

Marcello Salmeri ◽

Arianna Mencattini ◽

...

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Difference of 2-MeV electron-irradiation-induced performance degradation in FD-SOI MOSFETs fabricated on ELTRAN and UNIBOND wafers

2005 8th European Conference on Radiation and Its Effects on Components and Systems ◽

10.1109/radecs.2005.4365603 ◽

2005 ◽

Author(s):

Kiyoteru Hayama ◽

Kenichiro Takakura ◽

Hidenori Ohyama ◽

Joan Marc Rafi ◽

Abdelkarim Mercha ◽

...

Keyword(s):

Electron Irradiation ◽

Performance Degradation

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2005 8th European Conference on Radiation and Its Effects on Components and Systems
Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

New Details about the Frequency Behaviour of Irradiated Bipolar Op Amps

Total dose environment in SSR component on board Tsubasa (MDS-1) Satellite

Experimental and 3D Simulation Study on the Role of the Parasitic BJT Activation in SEB/SEGR of Power MOSFET

Three-Dimensional Modeling of the Two Photon Absorption Effect in a Complex Bipolar Transistor

X-ray High Dose Rate Investigation of Up-to-Date Space Mission Protection Technologies

Towards SET Mitigation in RF Digital PLLs: From Error Characterization to Radiation Hardening Considerations

Analysis of the Transient Response of High Performance 50-nm Partially Depleted SOI Transistors Using a Laser Probing Technique

RADECS 2005 Proceedings Comments by the Guest Editor

TID and SEE characterization and damaging analysis of 256 Mbit COTS SDRAM for IEEM application

Difference of 2-MeV electron-irradiation-induced performance degradation in FD-SOI MOSFETs fabricated on ELTRAN and UNIBOND wafers

Export Citation Format

2005 8th European Conference on Radiation and Its Effects on Components and SystemsLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

New Details about the Frequency Behaviour of Irradiated Bipolar Op Amps

Total dose environment in SSR component on board Tsubasa (MDS-1) Satellite

Experimental and 3D Simulation Study on the Role of the Parasitic BJT Activation in SEB/SEGR of Power MOSFET

Three-Dimensional Modeling of the Two Photon Absorption Effect in a Complex Bipolar Transistor

X-ray High Dose Rate Investigation of Up-to-Date Space Mission Protection Technologies

Towards SET Mitigation in RF Digital PLLs: From Error Characterization to Radiation Hardening Considerations

Analysis of the Transient Response of High Performance 50-nm Partially Depleted SOI Transistors Using a Laser Probing Technique

RADECS 2005 Proceedings Comments by the Guest Editor

TID and SEE characterization and damaging analysis of 256 Mbit COTS SDRAM for IEEM application

Difference of 2-MeV electron-irradiation-induced performance degradation in FD-SOI MOSFETs fabricated on ELTRAN and UNIBOND wafers

2005 8th European Conference on Radiation and Its Effects on Components and Systems
Latest Publications