2005 8th European Conference on Radiation and Its Effects on Components and Systems
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9780780395015
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Total dose environment in SSR component on board Tsubasa (MDS-1) Satellite

2005 ◽  
Author(s):  
Yugo Kimoto ◽  
Satoshi Ichikawa ◽  
Takeshi Sasada ◽  
Hideki Koshiishi ◽  
Haruhisa Matsumoto ◽  
...  
Keyword(s):  
Total Dose

Experimental and 3D Simulation Study on the Role of the Parasitic BJT Activation in SEB/SEGR of Power MOSFET

2005 ◽  
Author(s):  
A. Porzio ◽  
G. Busatto ◽  
F. Velardi ◽  
F. Iannuzzo ◽  
A. Sanseverino ◽  
...  
Keyword(s):  
Simulation Study ◽  
3D Simulation ◽  
Power Mosfet

Towards SET Mitigation in RF Digital PLLs: From Error Characterization to Radiation Hardening Considerations

2005 ◽  
Author(s):  
Y. Boulghassoul ◽  
L. W. Massengill ◽  
A. L. Steinberg ◽  
B. L. Bhuva ◽  
W. T. Holman
Keyword(s):  
Radiation Hardening ◽  
Error Characterization

Analysis of the Transient Response of High Performance 50-nm Partially Depleted SOI Transistors Using a Laser Probing Technique

2005 ◽  
Author(s):  
V. Ferlet-Cavrois ◽  
P. Paillet ◽  
D. McMorrow ◽  
J. S. Melinger ◽  
A. B. Campbell ◽  
...  
Keyword(s):  
Transient Response ◽  
High Performance ◽  
Laser Probing

TID and SEE characterization and damaging analysis of 256 Mbit COTS SDRAM for IEEM application

2005 ◽  
Author(s):  
Stefano Bertazzoni ◽  
Domenico Di Giovenale ◽  
Lorenzo Mongiardo ◽  
Marcello Salmeri ◽  
Arianna Mencattini ◽  
...  

Difference of 2-MeV electron-irradiation-induced performance degradation in FD-SOI MOSFETs fabricated on ELTRAN and UNIBOND wafers

2005 ◽  
Author(s):  
Kiyoteru Hayama ◽  
Kenichiro Takakura ◽  
Hidenori Ohyama ◽  
Joan Marc Rafi ◽  
Abdelkarim Mercha ◽  
...  
Keyword(s):  
Electron Irradiation ◽  
Performance Degradation
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