ICM 2001 Proceedings. The 13th International Conference on Microelectronics.
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Worst-case SPICE model generation for a process in development using Athena, Atlas, Utmost and Spayn

ICM 2001 Proceedings. The 13th International Conference on Microelectronics. ◽

10.1109/icm.2001.997475 ◽

2001 ◽

Cited By ~ 2

Author(s):

F. Duvivier ◽

E. Guichard

Keyword(s):

Model Generation ◽

Worst Case ◽

Spice Model

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Automating the verification of parameterized hardware using a hybrid tool

ICM 2001 Proceedings. The 13th International Conference on Microelectronics. ◽

10.1109/icm.2001.997659 ◽

2001 ◽

Author(s):

P. Curzon ◽

S. Tahar

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Power supply wires self-heating analysis

ICM 2001 Proceedings. The 13th International Conference on Microelectronics. ◽

10.1109/icm.2001.997501 ◽

2001 ◽

Author(s):

M. Casu ◽

M. Graziano ◽

M.R. Roch ◽

F. Viglione

Keyword(s):

Power Supply ◽

Self Heating

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Dynamic signal model in the surface channel charge coupled devices

ICM 2001 Proceedings. The 13th International Conference on Microelectronics. ◽

10.1109/icm.2001.997508 ◽

2001 ◽

Author(s):

S. Bri ◽

L. Zenkouar ◽

M. Yebari

Keyword(s):

Signal Model ◽

Charge Coupled Devices ◽

Dynamic Signal

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Electroluminescence analysis of neutron irradiation of JFETs

ICM 2001 Proceedings. The 13th International Conference on Microelectronics. ◽

10.1109/icm.2001.997490 ◽

2001 ◽

Author(s):

A. Ahaitouf ◽

M. Lahbabi ◽

M. Fliyou ◽

E. Abarkan ◽

A. Hoffmann ◽

...

Keyword(s):

Neutron Irradiation

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A polynomial division pipelined architecture for CRC error detecting codes

ICM 2001 Proceedings. The 13th International Conference on Microelectronics. ◽

10.1109/icm.2001.997505 ◽

2001 ◽

Author(s):

F. Monteiro ◽

A. Dandache ◽

A. M'Sir ◽

B. Lepley

Keyword(s):

Pipelined Architecture ◽

Error Detecting

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Design and characterization of a monolithic amplifier for millimeter wave

ICM 2001 Proceedings. The 13th International Conference on Microelectronics. ◽

10.1109/icm.2001.997516 ◽

2001 ◽

Author(s):

T. Marzolf ◽

W. Drissi ◽

L. Zenkouar

Keyword(s):

Millimeter Wave

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A simple approach for modeling the influence of hot-carrier effect on threshold voltage of MOS transistors

ICM 2001 Proceedings. The 13th International Conference on Microelectronics. ◽

10.1109/icm.2001.997482 ◽

2001 ◽

Cited By ~ 2

Author(s):

F. Kacar ◽

A. Kuntman ◽

H. Kuntman

Keyword(s):

Threshold Voltage ◽

Simple Approach ◽

Mos Transistors ◽

Hot Carrier ◽

Carrier Effect ◽

Hot Carrier Effect

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Fault diagnosis and fault localisation in integrated circuit by thermal method

ICM 2001 Proceedings. The 13th International Conference on Microelectronics. ◽

10.1109/icm.2001.997652 ◽

2001 ◽

Cited By ~ 1

Author(s):

P. Bratek ◽

A. Kos

Keyword(s):

Fault Diagnosis ◽

Integrated Circuit ◽

Thermal Method

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New hardware/software design methodologies

ICM 2001 Proceedings. The 13th International Conference on Microelectronics. ◽

10.1109/icm.2001.997473 ◽

2001 ◽

Cited By ~ 1

Author(s):

E.M. Aboulhamid

Keyword(s):

Software Design ◽

Design Methodologies

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ICM 2001 Proceedings. The 13th International Conference on Microelectronics.Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Worst-case SPICE model generation for a process in development using Athena, Atlas, Utmost and Spayn

Automating the verification of parameterized hardware using a hybrid tool

Power supply wires self-heating analysis

Dynamic signal model in the surface channel charge coupled devices

Electroluminescence analysis of neutron irradiation of JFETs

A polynomial division pipelined architecture for CRC error detecting codes

Design and characterization of a monolithic amplifier for millimeter wave

A simple approach for modeling the influence of hot-carrier effect on threshold voltage of MOS transistors

Fault diagnosis and fault localisation in integrated circuit by thermal method

New hardware/software design methodologies

ICM 2001 Proceedings. The 13th International Conference on Microelectronics.
Latest Publications