2012 IEEE International Reliability Physics Symposium (IRPS)
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9781457716805, 9781457716782, 9781457716799
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

The reliability approaches and requirements for IC component in telecom system

2012 ◽  
Author(s):  
Guofujun ◽  
Zhoujiang ◽  
Xieronghua

FET arrays as CPI sensors for 3D stacking and packaging characterization

2012 ◽  
Author(s):  
A. Ivankovic ◽  
V. Cherman ◽  
G. Van der Plas ◽  
B. Vandevelde ◽  
G. Beyer ◽  
...  
Keyword(s):  
3D Stacking

TSV defects and TSV-induced circuit failures: The third dimension in test and design-for-test

2012 ◽  
Author(s):  
Krishnendu Chakrabarty ◽  
Sergej Deutsch ◽  
Himanshu Thapliyal ◽  
Fangming Ye
Keyword(s):  
Design For Test ◽  
The Third ◽  
Third Dimension

Impact of interconnect length on BTI and HCI induced frequency degradation

2012 ◽  
Author(s):  
Xiaofei Wang ◽  
Pulkit Jain ◽  
Dong Jiao ◽  
Chris H. Kim

Direct correlation between specific trap formation and electric stress-induced degradation in MBE-grown AlGaN/GaN HEMTs

2012 ◽  
Author(s):  
A. Sasikumar ◽  
A. Arehart ◽  
S. A. Ringel ◽  
S. Kaun ◽  
M. H. Wong ◽  
...  
Keyword(s):  
Trap Formation ◽  
Electric Stress ◽  
Gan Hemts

A comprehensive and critical re-assessment of 2-stage energy level NBTI model

2012 ◽  
Author(s):  
Shashank Gupta ◽  
Binoy Jose ◽  
Kaustubh Joshi ◽  
Ankit Jain ◽  
Muhammad Ashraful Alam ◽  
...  
Keyword(s):  
Energy Level

New insights into SILC-based life time extraction

2012 ◽  
Author(s):  
C.D. Young ◽  
G. Bersuker ◽  
M. Jo ◽  
K. Matthews ◽  
J. Huang ◽  
...  
Keyword(s):  
Life Time

Fundamental failure mechanisms limiting maximum voltage operation in AlGaN/GaN HEMTs

2012 ◽  
Author(s):  
Michael D. Hodge ◽  
Ramakrishna Vetury ◽  
Jeffrey B. Shealy
Keyword(s):  
Failure Mechanisms ◽  
Gan Hemts ◽  
Maximum Voltage

Hot carrier degradation: From defect creation modeling to their impact on NMOS parameters

2012 ◽  
Author(s):  
Y. Mamy Randriamihaja ◽  
A. Zaka ◽  
V. Huard ◽  
M. Rafik ◽  
D. Rideau ◽  
...  
Keyword(s):  
Hot Carrier ◽  
Defect Creation ◽  
Hot Carrier Degradation
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