RF and Time-domain Techniques for Evaluating Novel Semiconductor Transistors
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Published By Springer International Publishing

9783030777746, 9783030777753

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Measurement of the Frequency Response of Transistors

RF and Time-domain Techniques for Evaluating Novel Semiconductor Transistors ◽

10.1007/978-3-030-77775-3_3 ◽

2021 ◽

pp. 37-68

Author(s):

Keith A. Jenkins

Keyword(s):

Frequency Response

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The Novel Transistor Characterization Challenge

RF and Time-domain Techniques for Evaluating Novel Semiconductor Transistors ◽

10.1007/978-3-030-77775-3_1 ◽

2021 ◽

pp. 1-9

Author(s):

Keith A. Jenkins

Keyword(s):

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Case Studies in the Evaluation of Novel Transistors

RF and Time-domain Techniques for Evaluating Novel Semiconductor Transistors ◽

10.1007/978-3-030-77775-3_4 ◽

2021 ◽

pp. 69-87

Author(s):

Keith A. Jenkins

Keyword(s):

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High-Frequency Test Equipment, Connections, and Contact with Transistors

RF and Time-domain Techniques for Evaluating Novel Semiconductor Transistors ◽

10.1007/978-3-030-77775-3_2 ◽

2021 ◽

pp. 11-35

Author(s):

Keith A. Jenkins

Keyword(s):

High Frequency ◽

Test Equipment ◽

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Measurement of the Large-Signal Propagation Delay of Single Transistors

RF and Time-domain Techniques for Evaluating Novel Semiconductor Transistors ◽

10.1007/978-3-030-77775-3_6 ◽

2021 ◽

pp. 103-126

Author(s):

Keith A. Jenkins

Keyword(s):

Signal Propagation ◽

Propagation Delay ◽

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Measurement of the Transient Response of Transistors

RF and Time-domain Techniques for Evaluating Novel Semiconductor Transistors ◽

10.1007/978-3-030-77775-3_7 ◽

2021 ◽

pp. 127-159

Author(s):

Keith A. Jenkins

Keyword(s):

Transient Response

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Measurement of the AC Linearity of Transistors

RF and Time-domain Techniques for Evaluating Novel Semiconductor Transistors ◽

10.1007/978-3-030-77775-3_5 ◽

2021 ◽

pp. 89-102

Author(s):

Keith A. Jenkins

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