JEDEC (formerly the GaAs REL Workshop) ROCS Workshop, 2004.
Latest Publications

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30

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JEDEC (formerly the GaAs REL Workshop) ROCS Workshop, 2004. ◽

10.1109/rocs.2004.184337 ◽

2004 ◽

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JEDEC (formerly the GaAs REL Workshop) ROCS Workshop, 2004. ◽

10.1109/rocs.2004.184328 ◽

2004 ◽

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The effect of elevated temperature lifetest on low frequency noise performance in GaAs PHEMT dual gate MMICs [LNA example]

JEDEC (formerly the GaAs REL Workshop) ROCS Workshop, 2004. ◽

10.1109/rocs.2004.184348 ◽

2004 ◽

Author(s):

Y.C. Chou ◽

D. Eng ◽

T. Block ◽

A. Oki ◽

L. Callejo ◽

...

Keyword(s):

Elevated Temperature ◽

Low Frequency ◽

Frequency Noise ◽

Noise Performance ◽

Low Frequency Noise ◽

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[Breaker page]

JEDEC (formerly the GaAs REL Workshop) ROCS Workshop, 2004. ◽

10.1109/rocs.2004.184338 ◽

2004 ◽

Download Full-text

[Breaker page]

JEDEC (formerly the GaAs REL Workshop) ROCS Workshop, 2004. ◽

10.1109/rocs.2004.184355 ◽

2004 ◽

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JEDEC

JEDEC (formerly the GaAs REL Workshop) ROCS Workshop, 2004. ◽

10.1109/rocs.2004.184332 ◽

2004 ◽

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The impact of emitter fingers layout and geometry on InGaP HBT thermal resistance

JEDEC (formerly the GaAs REL Workshop) ROCS Workshop, 2004. ◽

10.1109/rocs.2004.184342 ◽

2004 ◽

Author(s):

E.F. Yu ◽

D.G. Hill ◽

L. Zhang ◽

O.L. Hartin

Keyword(s):

Thermal Resistance ◽

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Degradation mechanisms of GaAs PHEMTs in high humidity conditions

JEDEC (formerly the GaAs REL Workshop) ROCS Workshop, 2004. ◽

10.1109/rocs.2004.184349 ◽

2004 ◽

Author(s):

T. Hisaka ◽

Y. Aihara ◽

Y. Nogami ◽

H. Sasaki ◽

Y. Uehara ◽

...

Keyword(s):

High Humidity ◽

Degradation Mechanisms

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Studying yield and reliability relationships for metal defects

JEDEC (formerly the GaAs REL Workshop) ROCS Workshop, 2004. ◽

10.1109/rocs.2004.184353 ◽

2004 ◽

Author(s):

W.J. Roesch ◽

D.J.M. Hamada

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Reliability of GaAs PIN switches for high frequency and high power applications

JEDEC (formerly the GaAs REL Workshop) ROCS Workshop, 2004. ◽

10.1109/rocs.2004.184354 ◽

2004 ◽

Author(s):

Xinxing Yang ◽

P. Ersland ◽

D. Hoag

Keyword(s):

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