JEDEC (formerly the GaAs REL Workshop) ROCS Workshop, 2004.
Latest Publications

TOTAL DOCUMENTS

30

(FIVE YEARS 0)

H-INDEX

2

(FIVE YEARS 0)

Published By IEEE

0790801051

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

The effect of elevated temperature lifetest on low frequency noise performance in GaAs PHEMT dual gate MMICs [LNA example]

JEDEC (formerly the GaAs REL Workshop) ROCS Workshop, 2004. ◽

10.1109/rocs.2004.184348 ◽

2004 ◽

Cited By ~ 1

Author(s):

Y.C. Chou ◽

D. Eng ◽

T. Block ◽

A. Oki ◽

L. Callejo ◽

...

Keyword(s):

Elevated Temperature ◽

Low Frequency ◽

Frequency Noise ◽

Noise Performance ◽

Low Frequency Noise ◽

Dual Gate

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[Blank page]

JEDEC (formerly the GaAs REL Workshop) ROCS Workshop, 2004. ◽

10.1109/rocs.2004.184337 ◽

2004 ◽

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[Blank page]

JEDEC (formerly the GaAs REL Workshop) ROCS Workshop, 2004. ◽

10.1109/rocs.2004.184328 ◽

2004 ◽

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[Breaker page]

JEDEC (formerly the GaAs REL Workshop) ROCS Workshop, 2004. ◽

10.1109/rocs.2004.184338 ◽

2004 ◽

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[Breaker page]

JEDEC (formerly the GaAs REL Workshop) ROCS Workshop, 2004. ◽

10.1109/rocs.2004.184355 ◽

2004 ◽

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JEDEC

JEDEC (formerly the GaAs REL Workshop) ROCS Workshop, 2004. ◽

10.1109/rocs.2004.184332 ◽

2004 ◽

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The impact of emitter fingers layout and geometry on InGaP HBT thermal resistance

JEDEC (formerly the GaAs REL Workshop) ROCS Workshop, 2004. ◽

10.1109/rocs.2004.184342 ◽

2004 ◽

Cited By ~ 1

Author(s):

E.F. Yu ◽

D.G. Hill ◽

L. Zhang ◽

O.L. Hartin

Keyword(s):

Thermal Resistance ◽

The Impact

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Degradation mechanisms of GaAs PHEMTs in high humidity conditions

JEDEC (formerly the GaAs REL Workshop) ROCS Workshop, 2004. ◽

10.1109/rocs.2004.184349 ◽

2004 ◽

Cited By ~ 4

Author(s):

T. Hisaka ◽

Y. Aihara ◽

Y. Nogami ◽

H. Sasaki ◽

Y. Uehara ◽

...

Keyword(s):

High Humidity ◽

Degradation Mechanisms

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Studying yield and reliability relationships for metal defects

JEDEC (formerly the GaAs REL Workshop) ROCS Workshop, 2004. ◽

10.1109/rocs.2004.184353 ◽

2004 ◽

Cited By ~ 4

Author(s):

W.J. Roesch ◽

D.J.M. Hamada

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Reliability of GaAs PIN switches for high frequency and high power applications

JEDEC (formerly the GaAs REL Workshop) ROCS Workshop, 2004. ◽

10.1109/rocs.2004.184354 ◽

2004 ◽

Author(s):

Xinxing Yang ◽

P. Ersland ◽

D. Hoag

Keyword(s):

High Power ◽

High Frequency

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