1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471)
Latest Publications

TOTAL DOCUMENTS

104
(FIVE YEARS 0)

H-INDEX

5
(FIVE YEARS 0)

Published By IEEE

0780357264
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

4H-SiC MESFETs behavior after high dose irradiation

2003 ◽  
Author(s):  
C. Brisset ◽  
O. Noblanc ◽  
C. Picard ◽  
F. Joffre ◽  
C. Brylinski
Keyword(s):  
High Dose ◽  
Dose Irradiation

Diamond gamma dose rate monitor

2003 ◽  
Author(s):  
A. Brambilla ◽  
P. Chambaud ◽  
D. Tromson ◽  
P. Bergonzo ◽  
F. Foulon
Keyword(s):  
Dose Rate ◽  
Gamma Dose ◽  
Gamma Dose Rate

Radiation hardening of power MOSFETs using electrical stress

2003 ◽  
Author(s):  
C. Picard ◽  
C. Brisset ◽  
O. Quittard ◽  
A. Hoffmann ◽  
F. Joffre ◽  
...  
Keyword(s):  
Radiation Hardening ◽  
Power Mosfets ◽  
Electrical Stress

Generation and confinement of mobile charges in buried oxide of SOI substrates

2003 ◽  
Author(s):  
O. Musseau ◽  
S. Krawiec ◽  
P. Paillet ◽  
A. Courtot-Descharles ◽  
O. Gruber
Keyword(s):  
Buried Oxide ◽  
Mobile Charges ◽  
Soi Substrates

New insights into fully-depleted SOI transistor response after total-dose irradiation

2003 ◽  
Author(s):  
J.R. Schwank ◽  
M.R. Shaneyfelt ◽  
P.E. Dodd ◽  
J.A. Burns ◽  
C.L. Keast ◽  
...  
Keyword(s):  
Total Dose ◽  
Fully Depleted ◽  
Dose Irradiation

Spatial and spectral oxide trap distributions in power MOSFETs

2003 ◽  
Author(s):  
A. Torres ◽  
O. Flament ◽  
C. Marcandella ◽  
O. Musseau ◽  
J.L. Leray
Keyword(s):  
Power Mosfets ◽  
Oxide Trap
Load More ...
Sign in / Sign up

Export Citation Format

Share Document