2007 IEEE International Conference on Integrated Circuit Design and Technology
Latest Publications

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Published By IEEE

1424407567, 1424407575

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

A Model for Negative Bias Temperature Instability in Oxide and High κ pFETs

2007 IEEE International Conference on Integrated Circuit Design and Technology ◽

10.1109/icicdt.2007.4299550 ◽

2007 ◽

Cited By ~ 4

Author(s):

S. Zafar

Keyword(s):

Negative Bias ◽

Negative Bias Temperature Instability ◽

Temperature Instability ◽

Bias Temperature Instability

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2Mb SPRAM Design: Bi-Directional Current Write and Parallelizing-Direction Current Read Schemes Based on Spin-Transfer Torque Switching

2007 IEEE International Conference on Integrated Circuit Design and Technology ◽

10.1109/icicdt.2007.4299581 ◽

2007 ◽

Cited By ~ 3

Author(s):

R. Takemura ◽

T. Kawahara ◽

K. Miura ◽

J. Hayakawa ◽

S. Ikeda ◽

...

Keyword(s):

Spin Transfer Torque ◽

Spin Transfer

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A design methodology of chip-to-chip wireless power transmission system

2007 IEEE International Conference on Integrated Circuit Design and Technology ◽

10.1109/icicdt.2007.4299559 ◽

2007 ◽

Cited By ~ 1

Author(s):

Kohei Onizuka ◽

Makoto Takamiya ◽

Hiroshi Kawaguchi ◽

Takayasu Sakurai

Keyword(s):

Design Methodology ◽

Power Transmission ◽

Transmission System ◽

Wireless Power ◽

Wireless Power Transmission ◽

Power Transmission System

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Technology, Design, and Implementation of High-K MIM Capacitors for High di/dt Applications: Microprocessor, IO, and Clocking

2007 IEEE International Conference on Integrated Circuit Design and Technology ◽

10.1109/icicdt.2007.4299556 ◽

2007 ◽

Author(s):

Hector Sanchez ◽

Om P. Mandhana ◽

Bill Johnstone ◽

Doug Roberts ◽

Joshua Siegel ◽

...

Keyword(s):

Technology Design ◽

Design And Implementation ◽

High K ◽

Mim Capacitors

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Technology and Application of 3D Interconnect

2007 IEEE International Conference on Integrated Circuit Design and Technology ◽

10.1109/icicdt.2007.4299567 ◽

2007 ◽

Cited By ~ 5

Author(s):

Robert E. Jones ◽

Ritwik Chatterjee ◽

Scott Pozder

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SRAM Yield Sensitivity to Supply Voltage Fluctuations and Its Implications on Vmin

2007 IEEE International Conference on Integrated Circuit Design and Technology ◽

10.1109/icicdt.2007.4299588 ◽

2007 ◽

Cited By ~ 6

Author(s):

Rouwaida Kanj ◽

Rajiv Joshi ◽

Sani Nassif

Keyword(s):

Supply Voltage ◽

Voltage Fluctuations ◽

Yield Sensitivity

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Misalignment of the Block Oxide Height in Self-Aligned bSPIFET

2007 IEEE International Conference on Integrated Circuit Design and Technology ◽

10.1109/icicdt.2007.4299555 ◽

2007 ◽

Cited By ~ 2

Author(s):

Jyi-Tsong Lin ◽

Yi-Chuen Eng

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Power, Performance, and Area Optimization Through the Use of Semiconductor Trench Decoupling Capacitors

2007 IEEE International Conference on Integrated Circuit Design and Technology ◽

10.1109/icicdt.2007.4299558 ◽

2007 ◽

Author(s):

Umberto Garofano ◽

Joseph W. Yoder ◽

Jeanne Paulette Bickford ◽

Charlie S. Ng

Keyword(s):

Power Performance ◽

Decoupling Capacitors ◽

Area Optimization

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Table of content

2007 IEEE International Conference on Integrated Circuit Design and Technology ◽

10.1109/icicdt.2007.4299524 ◽

2007 ◽

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Transistor Leakage Components & Effect of Leakage on VCO performance

2007 IEEE International Conference on Integrated Circuit Design and Technology ◽

10.1109/icicdt.2007.4299539 ◽

2007 ◽

Author(s):

Thuy Dao ◽

Phil Dahl ◽

Larry Connell ◽

Mike Bushman

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2007 IEEE International Conference on Integrated Circuit Design and TechnologyLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

A Model for Negative Bias Temperature Instability in Oxide and High κ pFETs

2Mb SPRAM Design: Bi-Directional Current Write and Parallelizing-Direction Current Read Schemes Based on Spin-Transfer Torque Switching

A design methodology of chip-to-chip wireless power transmission system

Technology, Design, and Implementation of High-K MIM Capacitors for High di/dt Applications: Microprocessor, IO, and Clocking

Technology and Application of 3D Interconnect

SRAM Yield Sensitivity to Supply Voltage Fluctuations and Its Implications on Vmin

Misalignment of the Block Oxide Height in Self-Aligned bSPIFET

Power, Performance, and Area Optimization Through the Use of Semiconductor Trench Decoupling Capacitors

Table of content

Transistor Leakage Components & Effect of Leakage on VCO performance

2007 IEEE International Conference on Integrated Circuit Design and Technology
Latest Publications