Springer Series in Surface Sciences - Surface Analysis Methods in Materials Science
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Published By Springer Berlin Heidelberg

9783662027691, 9783662027677

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Ultraviolet Photoelectron Spectroscopy of Solids

Springer Series in Surface Sciences - Surface Analysis Methods in Materials Science ◽

10.1007/978-3-662-02767-7_14 ◽

1992 ◽

pp. 291-300 ◽

Cited By ~ 2

Author(s):

R. Leckey

Keyword(s):

Photoelectron Spectroscopy ◽

Ultraviolet Photoelectron Spectroscopy

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Rutherford Backscattering Spectrometry and Nuclear Reaction Analysis

Springer Series in Surface Sciences - Surface Analysis Methods in Materials Science ◽

10.1007/978-3-662-02767-7_9 ◽

1992 ◽

pp. 203-219 ◽

Cited By ~ 3

Author(s):

S. H. Sie

Keyword(s):

Nuclear Reaction ◽

Rutherford Backscattering Spectrometry ◽

Rutherford Backscattering ◽

Nuclear Reaction Analysis

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SIMS — Secondary Ion Mass Spectrometry

Springer Series in Surface Sciences - Surface Analysis Methods in Materials Science ◽

10.1007/978-3-662-02767-7_5 ◽

1992 ◽

pp. 117-147 ◽

Cited By ~ 4

Author(s):

R. J. MacDonald ◽

B. V. King

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Thin Film Analysis

Springer Series in Surface Sciences - Surface Analysis Methods in Materials Science ◽

10.1007/978-3-662-02767-7_21 ◽

1992 ◽

pp. 403-415

Author(s):

G. C. Morris

Keyword(s):

Thin Film ◽

Film Analysis ◽

Thin Film Analysis

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Coated Steel

Springer Series in Surface Sciences - Surface Analysis Methods in Materials Science ◽

10.1007/978-3-662-02767-7_20 ◽

1992 ◽

pp. 387-401 ◽

Cited By ~ 1

Author(s):

R. Payling

Keyword(s):

Coated Steel

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UHV Basics

Springer Series in Surface Sciences - Surface Analysis Methods in Materials Science ◽

10.1007/978-3-662-02767-7_2 ◽

1992 ◽

pp. 67-76 ◽

Cited By ~ 1

Author(s):

C. Klauber

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Characterization of Oxidized Surfaces

Springer Series in Surface Sciences - Surface Analysis Methods in Materials Science ◽

10.1007/978-3-662-02767-7_19 ◽

1992 ◽

pp. 371-386

Author(s):

J. L. Cocking ◽

G. R. Johnston

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Characterization of Catalysts by Surface Analysis

Springer Series in Surface Sciences - Surface Analysis Methods in Materials Science ◽

10.1007/978-3-662-02767-7_17 ◽

1992 ◽

pp. 337-351 ◽

Cited By ~ 2

Author(s):

B. G. Baker

Keyword(s):

Surface Analysis

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Scanning Tunnelling Microscopy

Springer Series in Surface Sciences - Surface Analysis Methods in Materials Science ◽

10.1007/978-3-662-02767-7_10 ◽

1992 ◽

pp. 221-244

Author(s):

B. A. Sexton

Keyword(s):

Scanning Tunnelling Microscopy ◽

Scanning Tunnelling ◽

Tunnelling Microscopy

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X-Ray Photoelectron Spectroscopy

Springer Series in Surface Sciences - Surface Analysis Methods in Materials Science ◽

10.1007/978-3-662-02767-7_7 ◽

1992 ◽

pp. 165-186 ◽

Cited By ~ 4

Author(s):

M. H. Kibel

Keyword(s):

Photoelectron Spectroscopy ◽

X Ray

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Springer Series in Surface Sciences - Surface Analysis Methods in Materials ScienceLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By Springer Berlin Heidelberg

Ultraviolet Photoelectron Spectroscopy of Solids

Rutherford Backscattering Spectrometry and Nuclear Reaction Analysis

SIMS — Secondary Ion Mass Spectrometry

Thin Film Analysis

Coated Steel

UHV Basics

Characterization of Oxidized Surfaces

Characterization of Catalysts by Surface Analysis

Scanning Tunnelling Microscopy

X-Ray Photoelectron Spectroscopy

Springer Series in Surface Sciences - Surface Analysis Methods in Materials Science
Latest Publications