Secondary Ion Mass Spectrometry SIMS III - Springer Series in Chemical Physics
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Published By Springer Berlin Heidelberg

9783642881541, 9783642881527

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Metallurgical Applications of Ionic Microscopy

Secondary Ion Mass Spectrometry SIMS III - Springer Series in Chemical Physics ◽

10.1007/978-3-642-88152-7_68 ◽

1982 ◽

pp. 431-437

Author(s):

E. Darque-Ceretti ◽

R. Dennebouy ◽

J. C. Pivin ◽

C. Roques-Carmes

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Combined SIMS-AES-XPS Investigation of the Composition and Interface Structure of Anodic Oxide Layers on Cd0.2Hg0.8Te (CMT)

Secondary Ion Mass Spectrometry SIMS III - Springer Series in Chemical Physics ◽

10.1007/978-3-642-88152-7_56 ◽

1982 ◽

pp. 365-369

Author(s):

U. Kaiser ◽

O. Ganschow ◽

J. Neelsen ◽

H. M. Nitz ◽

L. Wiedmann ◽

...

Keyword(s):

Anodic Oxide ◽

Interface Structure ◽

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Applications of SIMS in Studies of Slow Diffusion and Isotope Diffusion

Secondary Ion Mass Spectrometry SIMS III - Springer Series in Chemical Physics ◽

10.1007/978-3-642-88152-7_53 ◽

1982 ◽

pp. 351-356

Author(s):

A. Lodding ◽

H. Odelius ◽

U. Södervall

Keyword(s):

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First Results on a Scanning Ion Microprobe Equipped with an EHD-Type Indium Primary Ion Source

Secondary Ion Mass Spectrometry SIMS III - Springer Series in Chemical Physics ◽

10.1007/978-3-642-88152-7_5 ◽

1982 ◽

pp. 43-48 ◽

Author(s):

F. G. Rüdenauer ◽

P. Pollinger ◽

H. Studnicka ◽

H. Gnaser ◽

W. Steiger ◽

...

Keyword(s):

Ion Microprobe ◽

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Depth Profiling of Copper Atoms Gettered in Ion-Damaged GaP

Secondary Ion Mass Spectrometry SIMS III - Springer Series in Chemical Physics ◽

10.1007/978-3-642-88152-7_46 ◽

1982 ◽

pp. 302-307

Author(s):

M. Griepentrog ◽

H. Kerkow ◽

H. Klose ◽

U. Müller-Jahreis

Keyword(s):

Depth Profiling

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Computer Peak Identification and Evaluation of SIMS Spectra

Secondary Ion Mass Spectrometry SIMS III - Springer Series in Chemical Physics ◽

10.1007/978-3-642-88152-7_45 ◽

1982 ◽

pp. 297-300 ◽

Author(s):

J. Antal ◽

S. Kugler ◽

M. Riedel

Keyword(s):

Peak Identification

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Application of the LTE Model to Quantifying the Secondary Ion Spectra of Steels

Secondary Ion Mass Spectrometry SIMS III - Springer Series in Chemical Physics ◽

10.1007/978-3-642-88152-7_39 ◽

1982 ◽

pp. 264-268 ◽

Author(s):

J. Suba ◽

A. Stopka

Keyword(s):

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Quantitative Chemical Analysis of Standard Iron Alloys by SIMS

Secondary Ion Mass Spectrometry SIMS III - Springer Series in Chemical Physics ◽

10.1007/978-3-642-88152-7_38 ◽

1982 ◽

pp. 257-263 ◽

Author(s):

Z. Jurela

Keyword(s):

Chemical Analysis ◽

Iron Alloys ◽

Quantitative Chemical Analysis ◽

Quantitative Chemical

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Depth Resolution of Ion Bombardment Technique Applied to NiPd, NiPt, PtPd, Thin Layer Systems

Secondary Ion Mass Spectrometry SIMS III - Springer Series in Chemical Physics ◽

10.1007/978-3-642-88152-7_32 ◽

1982 ◽

pp. 216-221 ◽

Author(s):

J. Giber ◽

D. Marton ◽

J. László ◽

J. Mizsei

Keyword(s):

Depth Resolution ◽

Ion Bombardment

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Some Problems of Construction Implied by Requirements of Up-To-Date SIMS Instrumentation

Secondary Ion Mass Spectrometry SIMS III - Springer Series in Chemical Physics ◽

10.1007/978-3-642-88152-7_2 ◽

1982 ◽

pp. 22-29 ◽

Author(s):

R. L. Gerlach

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