Proceedings of 14th VLSI Test Symposium
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76

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Published By IEEE Comput. Soc. Press

0818673044

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Test response compaction using arithmetic functions

Proceedings of 14th VLSI Test Symposium ◽

10.1109/vtest.1996.510882 ◽

2002 ◽

Author(s):

A.P. Stroele

Keyword(s):

Arithmetic Functions ◽

Test Response ◽

Test Response Compaction

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A self-checking ALU design with efficient codes

Proceedings of 14th VLSI Test Symposium ◽

10.1109/vtest.1996.510851 ◽

2002 ◽

Author(s):

S.S. Gorshe ◽

B. Bose

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Non-robust tests for stuck-fault detection using signal waveform analysis: feasibility and advantages

Proceedings of 14th VLSI Test Symposium ◽

10.1109/vtest.1996.510879 ◽

2002 ◽

Author(s):

A. Chatterjee ◽

R. Jayabharathi ◽

P. Pant ◽

J.A. Abraham

Keyword(s):

Fault Detection ◽

Waveform Analysis ◽

Signal Waveform ◽

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A self-driven test structure for pseudorandom testing of non-scan sequential circuits

Proceedings of 14th VLSI Test Symposium ◽

10.1109/vtest.1996.510830 ◽

2002 ◽

Author(s):

F. Muradali ◽

J. Rajski

Keyword(s):

Sequential Circuits ◽

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Testing "untestable" faults in three-state circuits

Proceedings of 14th VLSI Test Symposium ◽

10.1109/vtest.1996.510875 ◽

2002 ◽

Author(s):

P. Wohl ◽

J. Waicukauski ◽

M. Graf

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A new digital test approach for analog-to-digital converter testing

Proceedings of 14th VLSI Test Symposium ◽

10.1109/vtest.1996.510836 ◽

2002 ◽

Author(s):

M. Ehsanian ◽

B. Kaminska ◽

K. Arabi

Keyword(s):

Analog To Digital Converter ◽

Digital Converter ◽

Analog To Digital ◽

Digital Test ◽

Converter Testing

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Current signatures [VLSI circuit testing]

Proceedings of 14th VLSI Test Symposium ◽

10.1109/vtest.1996.510844 ◽

2002 ◽

Author(s):

A.E. Gattiker ◽

W. Maly

Keyword(s):

Vlsi Circuit ◽

Circuit Testing ◽

Current Signatures

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Bridging fault coverage improvement by power supply control

Proceedings of 14th VLSI Test Symposium ◽

10.1109/vtest.1996.510877 ◽

2002 ◽

Author(s):

M. Renovell ◽

P. Huc ◽

Y. Bertrand

Keyword(s):

Power Supply ◽

Fault Coverage ◽

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Improving the accuracy of diagnostics provided by fault dictionaries

Proceedings of 14th VLSI Test Symposium ◽

10.1109/vtest.1996.510855 ◽

2002 ◽

Author(s):

J.W. Sheppard ◽

W.R. Simpson

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Generating deterministic unordered test patterns with counters

Proceedings of 14th VLSI Test Symposium ◽

10.1109/vtest.1996.510881 ◽

2002 ◽

Author(s):

D. Kagaris ◽

S. Tragoudas

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