2013 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM)
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9781479901296, 9781479901265, 9781479901272
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

A 2GSps 12bit DAC with SFDR >57.5dBc up to Nyquist bandwidth

2013 ◽  
Author(s):  
Lei Zhou ◽  
Danyu Wu ◽  
Fan Jiang ◽  
Jin Wu ◽  
Zhi Jin ◽  
...  

Impact of reverse EB stress and mixed-mode stress on low-frequency noise for SiGe HBTs in forward and inverse modes

2013 ◽  
Author(s):  
Jin Tang ◽  
Jonggook Kim ◽  
Jeff A. Babcock ◽  
Alexei Sadovnikov ◽  
Tracey L. Krakowski
Keyword(s):  
Mixed Mode ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Mode Stress

A transient triggered bipolar clamp for electrostatic discharge protection in SiGe BiCMOS technologies

2013 ◽  
Author(s):  
Srivatsan Parthasarathy ◽  
Javier A. Salcedo ◽  
Jean-Jacques Hajjar
Keyword(s):  
Electrostatic Discharge ◽  
Sige Bicmos

A scalable model for temperature dependent thermal resistance of SiGe HBTs

2013 ◽  
Author(s):  
Amit Kumar Sahoo ◽  
Sebastien Fregonese ◽  
Mario Weiss ◽  
Cristell Maneux ◽  
Thomas Zimmer
Keyword(s):  
Thermal Resistance ◽  
Temperature Dependent

Comparative analysis of compact noise model formulations for SiGe-HBTs

2013 ◽  
Author(s):  
Francesco Vitale ◽  
Ramses van der Toorn
Keyword(s):  
Comparative Analysis ◽  
Noise Model

A SiGe bipolar 6 bit 20 GS/s Nyquist-rate flash ADC without time interleaving

2013 ◽  
Author(s):  
Philipp Ritter ◽  
Stephane Le Tual ◽  
Bruno Allard ◽  
Michael Moller
Keyword(s):  
Time Interleaving ◽  
Flash Adc ◽  
Nyquist Rate
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