2016 IEEE International Reliability Physics Symposium (IRPS)
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159

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8

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Published By IEEE

9781467391375

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Technical program

2016 IEEE International Reliability Physics Symposium (IRPS) ◽

10.1109/irps.2016.7574503 ◽

2016 ◽

Keyword(s):

Technical Program

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Aging of I/O overdrive circuit in FinFET technology and strategy for design optimization

2016 IEEE International Reliability Physics Symposium (IRPS) ◽

10.1109/irps.2016.7574592 ◽

2016 ◽

Author(s):

S. E. Liu ◽

M. H. Yu ◽

Y. R. Chen ◽

J. Y. Jao ◽

M. Z. Lin ◽

...

Keyword(s):

Design Optimization

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Spontaneous photon emission from 32 nm and 14 nm SOI FETs

2016 IEEE International Reliability Physics Symposium (IRPS) ◽

10.1109/irps.2016.7574577 ◽

2016 ◽

Author(s):

Franco Stellari ◽

Alessandro Ruggeri ◽

Andrea Bahgat Shehata ◽

Herschel Ainspan ◽

Peilin Song

Keyword(s):

Photon Emission

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Spatio-temporal mapping of device temperature due to self-heating in Sub-22 nm transistors

2016 IEEE International Reliability Physics Symposium (IRPS) ◽

10.1109/irps.2016.7574647 ◽

2016 ◽

Author(s):

Muhammad A. Wahab ◽

SangHoon Shin ◽

Muhammad A. Alam

Keyword(s):

Self Heating ◽

Spatio Temporal

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Temperature sense effect in HCI self-heating de convolution: Application to 28nm FDSOI

2016 IEEE International Reliability Physics Symposium (IRPS) ◽

10.1109/irps.2016.7574651 ◽

2016 ◽

Author(s):

X. Federspiel ◽

G. Torrente ◽

W. Arfaoui ◽

F. Cacho ◽

V. Huard

Keyword(s):

Self Heating ◽

Temperature Sense

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Bidirectional NPN ESD protection in silicon photonics technology

2016 IEEE International Reliability Physics Symposium (IRPS) ◽

10.1109/irps.2016.7574520 ◽

2016 ◽

Author(s):

Roman Boschke ◽

Shih-Hung Chen ◽

Geert Hellings ◽

Mirko Scholz ◽

Peter De Heyn ◽

...

Keyword(s):

Silicon Photonics ◽

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Software-based dynamic reliability management for GPU applications

2016 IEEE International Reliability Physics Symposium (IRPS) ◽

10.1109/irps.2016.7574507 ◽

2016 ◽

Author(s):

Si Li ◽

Vilas Sridharan ◽

Sudhanva Gurumurthi ◽

Sudhakar Yalamanchili

Keyword(s):

Dynamic Reliability ◽

Reliability Management

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Estimation of single-event transient pulse characteristics for predictive analysis

2016 IEEE International Reliability Physics Symposium (IRPS) ◽

10.1109/irps.2016.7574641 ◽

2016 ◽

Author(s):

T. R. Assis ◽

J. S. Kauppila ◽

B. L. Bhuva ◽

R. D. Schrimpf ◽

L. W. Massengill ◽

...

Keyword(s):

Predictive Analysis ◽

Single Event ◽

Single Event Transient ◽

Pulse Characteristics

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Dynamical observation of H-induced gate dielectric degradation through improved nuclear reaction analysis system

2016 IEEE International Reliability Physics Symposium (IRPS) ◽

10.1109/irps.2016.7574578 ◽

2016 ◽

Author(s):

Yusuke Higashi ◽

Riichiro Takaishi ◽

Masamichi Suzuki ◽

Yasushi Nakasaki ◽

Mitsuhiro Tomita ◽

...

Keyword(s):

Nuclear Reaction ◽

Gate Dielectric ◽

Nuclear Reaction Analysis ◽

Analysis System ◽

Dielectric Degradation

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Tutorial and year in review program: TU1-1: Introduction to reliability physics and engineering

2016 IEEE International Reliability Physics Symposium (IRPS) ◽

10.1109/irps.2016.7574500 ◽

2016 ◽

Author(s):

Charles Slayman ◽

Joe McPherson

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