Predicting the vulnerability of memories to muon-induced SEUs with low-energy proton tests informed by Monte Carlo simulations

2016 ◽  
Author(s):  
J. M. Trippe ◽  
R. A. Reed ◽  
B. D. Sierawski ◽  
R. A. Weller ◽  
R. A. Austin ◽  
...  
Keyword(s):  
Monte Carlo ◽  
Monte Carlo Simulations ◽  
Low Energy ◽  
Energy Proton

scholarly journals Monte Carlo simulations of a low energy proton beamline for radiobiological experiments

2017 ◽  
Vol 56 (6) ◽  
pp. 779-786 ◽  
Author(s):  
Tordis J. Dahle ◽  
Anne Marit Rykkelid ◽  
Camilla H. Stokkevåg ◽  
Andrea Mairani ◽  
Andreas Görgen ◽  
...  
Keyword(s):  
Monte Carlo ◽  
Monte Carlo Simulations ◽  
Low Energy ◽  
Energy Proton

scholarly journals OC-0342: Monte Carlo simulations of a low energy proton beam and estimation of LET distributions

2017 ◽  
Vol 123 ◽  
pp. S179-S180
Author(s):  
T.J. Dahle ◽  
A.M. Rykkelid ◽  
C.H. Stokkevåg ◽  
A. Görgen ◽  
N.J. Edin ◽  
...  
Keyword(s):  
Monte Carlo ◽  
Monte Carlo Simulations ◽  
Proton Beam ◽  
Low Energy ◽  
Energy Proton

Monte Carlo simulation of induced radioactivity for low-energy proton beam

2012 ◽  
Vol 24 (12) ◽  
pp. 2979-2982
Author(s):  
王韬 Wang Tao ◽  
荆晓兵 Jing Xiaobing ◽  
庞建 Pang Jian ◽  
何小中 He Xiaozhong ◽  
张开志 Zhang Kaizhi ◽  
...  
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Proton Beam ◽  
Low Energy ◽  
Energy Proton ◽  
Induced Radioactivity

Interface dosimetry: measurements and Monte Carlo simulations of low-energy photon beams

2001 ◽  
Vol 61 (3-6) ◽  
pp. 593-595 ◽  
Author(s):  
Indra J. Das ◽  
Alireza Kassaee ◽  
Frank Verhaegen ◽  
Vadim P. Moskvin
Keyword(s):  
Monte Carlo ◽  
Monte Carlo Simulations ◽  
Low Energy ◽  
Photon Beams ◽  
Energy Photon

Quantitative Analysis of the Evolution of Surface Growth Morphology in LEEM

1998 ◽  
Vol 05 (06) ◽  
pp. 1151-1158 ◽  
Author(s):  
J. B. Hannon ◽  
G. L. Kellogg ◽  
M. C. Bartelt ◽  
N. C. Bartelt
Keyword(s):  
Electron Microscopy ◽  
Monte Carlo ◽  
Quantitative Analysis ◽  
Diffusion Equation ◽  
Monte Carlo Simulations ◽  
Low Energy ◽  
Growth Morphology ◽  
Equation Analysis ◽  
Low Energy Electron ◽  
And Diffusion

We describe Monte Carlo simulations and diffusion equation analysis which are useful in deriving kinetic parameters from low energy electron microscopy experiments. An analysis of the etching of the Si(001) surface with molecular oxygen is made, illustrating the power of these techniques.

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