Proceedings. Tenth Annual IEEE International ASIC Conference and Exhibit (Cat. No.97TH8334)
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A prototype supply current monitor for testing analogue circuits

Proceedings. Tenth Annual IEEE International ASIC Conference and Exhibit (Cat. No.97TH8334) ◽

10.1109/asic.1997.616974 ◽

2002 ◽

Cited By ~ 2

Author(s):

M.A. Al-Qutayri ◽

W.J. Tenten ◽

P.R. Shepherd

Keyword(s):

Analogue Circuits ◽

Supply Current

Energy saving techniques for architecture design of portable embedded devices

Proceedings. Tenth Annual IEEE International ASIC Conference and Exhibit (Cat. No.97TH8334) ◽

10.1109/asic.1997.616998 ◽

2002 ◽

Cited By ~ 1

Author(s):

V.G. Moshnyaga ◽

K. Tamaru

Keyword(s):

Energy Saving ◽

Architecture Design ◽

Embedded Devices

On the relationship among accuracy, tolerance and compensation in the deep sub-micron era

Proceedings. Tenth Annual IEEE International ASIC Conference and Exhibit (Cat. No.97TH8334) ◽

10.1109/asic.1997.616986 ◽

2002 ◽

Author(s):

D. Hill ◽

A. Domic

Keyword(s):

The Relationship

A portable printer controller ASIC design using behavioral compiler

Proceedings. Tenth Annual IEEE International ASIC Conference and Exhibit (Cat. No.97TH8334) ◽

10.1109/asic.1997.616983 ◽

2002 ◽

Author(s):

T. Chan ◽

B. Yeh

Keyword(s):

Asic Design

Low-voltage floating-gate current mirrors

Proceedings. Tenth Annual IEEE International ASIC Conference and Exhibit (Cat. No.97TH8334) ◽

10.1109/asic.1997.616971 ◽

2002 ◽

Cited By ~ 9

Author(s):

Y. Berg ◽

T.S. Lande ◽

S. Naess

Keyword(s):

Low Voltage ◽

Floating Gate ◽

Gate Current ◽

Current Mirrors

HDL generation from parameterized schematic design system

Proceedings. Tenth Annual IEEE International ASIC Conference and Exhibit (Cat. No.97TH8334) ◽

10.1109/asic.1997.616992 ◽

2002 ◽

Cited By ~ 1

Author(s):

A. Mathur ◽

P. Parikh ◽

A. Mujumdar ◽

R. Shur ◽

T. Bulgerin ◽

...

Keyword(s):

Design System ◽

Schematic Design

Challenges and approaches in mixed signal RF testing

Proceedings. Tenth Annual IEEE International ASIC Conference and Exhibit (Cat. No.97TH8334) ◽

10.1109/asic.1997.616973 ◽

2002 ◽

Cited By ~ 10

Author(s):

M. Soma

Keyword(s):

Mixed Signal ◽

Rf Testing

Boundary scan adaption for active substrate MCM-test

Proceedings. Tenth Annual IEEE International ASIC Conference and Exhibit (Cat. No.97TH8334) ◽

10.1109/asic.1997.616979 ◽

2002 ◽

Cited By ~ 1

Author(s):

H. Werkmann ◽

B. Hofflinger ◽

B. Laquai

Keyword(s):

Boundary Scan ◽

Active Substrate

An efficient statistical method to estimate average power in sequential circuits considering input sensitivities

Proceedings. Tenth Annual IEEE International ASIC Conference and Exhibit (Cat. No.97TH8334) ◽

10.1109/asic.1997.617003 ◽

2002 ◽

Author(s):

Zhanping Chen ◽

K. Roy

Keyword(s):

Statistical Method ◽

Average Power ◽

Sequential Circuits

An easy approach to formal verification

Proceedings. Tenth Annual IEEE International ASIC Conference and Exhibit (Cat. No.97TH8334) ◽

10.1109/asic.1997.616990 ◽

2002 ◽

Cited By ~ 3

Author(s):

T. Schlipf ◽

T. Buchner ◽

R. Fritz ◽

M. Helms

Keyword(s):

Formal Verification

Proceedings. Tenth Annual IEEE International ASIC Conference and Exhibit (Cat. No.97TH8334)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

A prototype supply current monitor for testing analogue circuits

Energy saving techniques for architecture design of portable embedded devices

On the relationship among accuracy, tolerance and compensation in the deep sub-micron era

A portable printer controller ASIC design using behavioral compiler

Low-voltage floating-gate current mirrors

HDL generation from parameterized schematic design system

Challenges and approaches in mixed signal RF testing

Boundary scan adaption for active substrate MCM-test

An efficient statistical method to estimate average power in sequential circuits considering input sensitivities

An easy approach to formal verification

Proceedings. Tenth Annual IEEE International ASIC Conference and Exhibit (Cat. No.97TH8334)
Latest Publications