High-? Gate Dielectrics
Latest Publications

TOTAL DOCUMENTS

20

(FIVE YEARS 0)

H-INDEX

2

(FIVE YEARS 0)

Published By IOP Publishing Ltd

0750309067

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Index

High-? Gate Dielectrics ◽

10.1887/0750309067/b1246b2 ◽

2004 ◽

Download Full-text

High-? transistor characteristics

High-? Gate Dielectrics ◽

10.1887/0750309067/b1246c17 ◽

2004 ◽

Cited By ~ 1

Author(s):

Jack C Lee ◽

Katsunori Onishi

Download Full-text

Device architectures for the nano-CMOS era

High-? Gate Dielectrics ◽

10.1887/0750309067/b1246c16 ◽

2004 ◽

Author(s):

Simon Deleonibus

Download Full-text

Device integration issues

High-? Gate Dielectrics ◽

10.1887/0750309067/b1246c15 ◽

2004 ◽

Author(s):

E W A Young ◽

V Kaushik

Keyword(s):

Device Integration

Download Full-text

Electronic structure and band offsets of high-dielectric-constant gate oxides

High-? Gate Dielectrics ◽

10.1887/0750309067/b1246c11 ◽

2004 ◽

Author(s):

J Robertson ◽

P W Peacock

Keyword(s):

Dielectric Constant ◽

Electronic Structure ◽

High Dielectric Constant ◽

Gate Oxides ◽

Band Offsets ◽

High Dielectric

Download Full-text

Chemical bonding and electronic structure of high-? transition metal dielectrics: applications to interfacial band offset energies and electronically active defects

High-? Gate Dielectrics ◽

10.1887/0750309067/b1246c10 ◽

2004 ◽

Author(s):

Gerald Lucovsky ◽

Jerry L Whitten

Keyword(s):

Electronic Structure ◽

Transition Metal ◽

Chemical Bonding ◽

Band Offset ◽

High Transition

Download Full-text

Defect generation under electrical stress: experimental characterization and modelling

High-? Gate Dielectrics ◽

10.1887/0750309067/b1246c14 ◽

2004 ◽

Author(s):

Michel Houssa

Keyword(s):

Experimental Characterization ◽

Defect Generation ◽

Electrical Stress

Download Full-text

Ab initio calculations of the structural, electronic and dynamical properties of high-? dielectrics

High-? Gate Dielectrics ◽

10.1887/0750309067/b1246c13 ◽

2004 ◽

Cited By ~ 1

Author(s):

Gian-Marco Rignanese ◽

Xavier Gonze ◽

Alfredo Pasquarello

Keyword(s):

Ab Initio Calculations ◽

Ab Initio ◽

Dynamical Properties

Download Full-text

Defects in stacks of Si with nanometre thick high-? dielectric layers: characterization and identification by electron spin resonance

High-? Gate Dielectrics ◽

10.1887/0750309067/b1246c6 ◽

2004 ◽

Cited By ~ 1

Author(s):

A Stesmans ◽

V V Afanas'ev

Keyword(s):

Electron Spin Resonance ◽

Electron Spin ◽

Dielectric Layers ◽

Spin Resonance ◽

High Dielectric

Download Full-text

Pulsed laser deposition of dielectrics

High-? Gate Dielectrics ◽

10.1887/0750309067/b1246c4 ◽

2004 ◽

Author(s):

Dave H A Blank ◽

Lianne M Doeswijk ◽

Koray Karakaya ◽

Gertjan Koster ◽

Guus Rijnders

Keyword(s):

Pulsed Laser Deposition ◽

Pulsed Laser ◽

Laser Deposition

Download Full-text