Advances in X-Ray Analysis
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TOTAL DOCUMENTS

100

(FIVE YEARS 0)

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3

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Published By Springer US

9780306458033, 9781461553779

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

A Supported Ultrathin Window for Improved Performance in Gas Flow Proportional Counters

Advances in X-Ray Analysis ◽

10.1007/978-1-4615-5377-9_99 ◽

1997 ◽

pp. 881-884

Author(s):

Andrew J. Nelson ◽

David Tingey ◽

Takashi Shoji ◽

Kazuaki Shimizu

Keyword(s):

Gas Flow ◽

Proportional Counters ◽

Improved Performance

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Recent Developments in Txrf of Light Elements

Advances in X-Ray Analysis ◽

10.1007/978-1-4615-5377-9_86 ◽

1997 ◽

pp. 771-779 ◽

Author(s):

Christina Streli ◽

V. Bauer ◽

P. Wobrauschek

Keyword(s):

Light Elements ◽

Recent Developments

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X-Ray Powder Diffraction Patterns As Random Fractals

Advances in X-Ray Analysis ◽

10.1007/978-1-4615-5377-9_82 ◽

1997 ◽

pp. 739-746

Author(s):

Dana T. Griffen ◽

Kim R. Sullivan

Keyword(s):

Powder Diffraction ◽

X Ray ◽

Random Fractals ◽

Diffraction Patterns

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X-Ray Characterization Of Phase Equilibria Of the Raveau and 2212 Phases in the Bi-Sr-Ca-Cu-O System

Advances in X-Ray Analysis ◽

10.1007/978-1-4615-5377-9_81 ◽

1997 ◽

pp. 731-738

Author(s):

Winnie Wong-Ng ◽

Lawrence P. Cook ◽

F. Jiang

Keyword(s):

Phase Equilibria ◽

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Controlled-Humidity Xrd Analyses: Application to the Study of Smectite Expansion/Contraction

Advances in X-Ray Analysis ◽

10.1007/978-1-4615-5377-9_79 ◽

1997 ◽

pp. 713-722 ◽

Author(s):

Steve J. Chipera ◽

J. William Carey ◽

David. L. Bish

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Determination of Thickness and Composition of Thin AlxGa1-xAs Films on GaAs Substrates by Total Electron Yield (Tey) Measurements

Advances in X-Ray Analysis ◽

10.1007/978-1-4615-5377-9_75 ◽

1997 ◽

pp. 683-694 ◽

Author(s):

Horst Ebel ◽

Robert Svagera ◽

Maria F. Ebel ◽

Norbert Zagler

Keyword(s):

Total Electron Yield ◽

Total Electron ◽

Gaas Substrates ◽

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The In-Situ Observation of Organic Thin Films During Growth Process by Using Grazing Incidence X-Ray Diffraction and Fluorescence Methods

Advances in X-Ray Analysis ◽

10.1007/978-1-4615-5377-9_71 ◽

1997 ◽

pp. 653-658

Author(s):

Kouichi Hayashi ◽

Toshihisa Horiuchi ◽

Kazumi Matsushige

Keyword(s):

Growth Process ◽

Organic Thin Films ◽

Grazing Incidence ◽

In Situ Observation ◽

X Ray Diffraction ◽

X Ray ◽

Fluorescence Methods

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The Evolution of XRF Instrumentation Within Oxford Instruments

Advances in X-Ray Analysis ◽

10.1007/978-1-4615-5377-9_7 ◽

1997 ◽

pp. 53-56

Author(s):

B. J. Price ◽

A. T. Ellis

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Characterisation and Modelling of Peak Shifts in Conventional Powder Diffractometry

Advances in X-Ray Analysis ◽

10.1007/978-1-4615-5377-9_63 ◽

1997 ◽

pp. 579-585

Author(s):

Robert W. Cheary ◽

Maree Anast ◽

James P. Cline

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Results of X-Ray Powder Diffraction Round Robin Tests with Corundum Plates and Powder Samples

Advances in X-Ray Analysis ◽

10.1007/978-1-4615-5377-9_62 ◽

1997 ◽

pp. 571-577

Author(s):

V. Valvoda ◽

D. Rafaja ◽

R. Jenkins

Keyword(s):

Powder Diffraction ◽

Round Robin ◽

X Ray ◽

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