2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS)
Latest Publications

TOTAL DOCUMENTS

60

(FIVE YEARS 60)

H-INDEX

2

(FIVE YEARS 2)

Published By IEEE

9781728114644, 9781728114668

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Comparison of MOSFET Threshold Voltage Extraction Methods with Temperature Variation

2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts.2019.8730978 ◽

2019 ◽

Author(s):

Yu-Hsing Cheng

Keyword(s):

Temperature Variation ◽

Threshold Voltage ◽

Extraction Methods

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Modeling and Test Structures for Accurate Current Sensing in Vertical Power FETs

2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts.2019.8730949 ◽

2019 ◽

Author(s):

Min Chu ◽

Tikno Harjono ◽

Kuntal Joardar ◽

Vijay Krishnamurthy

Keyword(s):

Current Sensing

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A Study of Power Supply Stability in Ring Oscillator Structures

2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts.2019.8730980 ◽

2019 ◽

Author(s):

Brad Smith ◽

Donald Hall ◽

Bill Verzi ◽

Dan Pechonis

Keyword(s):

Power Supply ◽

Ring Oscillator

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Analysis of Test Structure Design Induced Variation in on Si On-wafer TRL Calibration in sub-THz

2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts.2019.8730962 ◽

2019 ◽

Author(s):

Chandan Yadav ◽

Sebastien Fregonese ◽

Marina Deng ◽

Marco Cabbia ◽

Magali De Matos ◽

...

Keyword(s):

Structure Design ◽

Test Structure ◽

Induced Variation

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Continuity assessment for supercritical-fluids-deposited (SCFD) Cu film as electroplating seed layer

2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts.2019.8730945 ◽

2019 ◽

Author(s):

Naoto Usami ◽

Etsuko Ota ◽

Akio Higo ◽

Takeshi Momose ◽

Yoshio Mita

Keyword(s):

Supercritical Fluids ◽

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Probing impact on pad moisture tightness: A challenge for pad size reduction

2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts.2019.8730990 ◽

2019 ◽

Author(s):

Matthias Vidal-Dho ◽

Quentin Hubert ◽

Patrice Gonon ◽

Philippe Delorme ◽

Jonathan Jacquot ◽

...

Keyword(s):

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Chairman's Letter

2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts.2019.8730994 ◽

2019 ◽

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[Copyright notice]

2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts.2019.8730917 ◽

2019 ◽

Keyword(s):

Copyright Notice

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Session 9: Packaging

2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts.2019.8730961 ◽

2019 ◽

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High-k Oxides on Hydrogenated-Diamond for Metal-Oxide-Semiconductor Field-Effect Transistors [Invited]

2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS) ◽

10.1109/icmts.2019.8730974 ◽

2019 ◽

Author(s):

Yasuo Koide

Keyword(s):

Metal Oxide ◽

Field Effect ◽

Field Effect Transistors ◽

Metal Oxide Semiconductor ◽

Oxide Semiconductor ◽

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