2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS)
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60
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2
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Published By IEEE

9781728114644, 9781728114668
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Modeling and Test Structures for Accurate Current Sensing in Vertical Power FETs

2019 ◽  
Author(s):  
Min Chu ◽  
Tikno Harjono ◽  
Kuntal Joardar ◽  
Vijay Krishnamurthy
Keyword(s):  
Current Sensing

A Study of Power Supply Stability in Ring Oscillator Structures

2019 ◽  
Author(s):  
Brad Smith ◽  
Donald Hall ◽  
Bill Verzi ◽  
Dan Pechonis
Keyword(s):  
Power Supply ◽  
Ring Oscillator

Analysis of Test Structure Design Induced Variation in on Si On-wafer TRL Calibration in sub-THz

2019 ◽  
Author(s):  
Chandan Yadav ◽  
Sebastien Fregonese ◽  
Marina Deng ◽  
Marco Cabbia ◽  
Magali De Matos ◽  
...  
Keyword(s):  
Structure Design ◽  
Test Structure ◽  
Induced Variation

Continuity assessment for supercritical-fluids-deposited (SCFD) Cu film as electroplating seed layer

2019 ◽  
Author(s):  
Naoto Usami ◽  
Etsuko Ota ◽  
Akio Higo ◽  
Takeshi Momose ◽  
Yoshio Mita
Keyword(s):  
Supercritical Fluids ◽  
Seed Layer ◽  
Cu Film

Probing impact on pad moisture tightness: A challenge for pad size reduction

2019 ◽  
Author(s):  
Matthias Vidal-Dho ◽  
Quentin Hubert ◽  
Patrice Gonon ◽  
Philippe Delorme ◽  
Jonathan Jacquot ◽  
...  
Keyword(s):  
Size Reduction
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