Semiconductor Device Reliability
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TOTAL DOCUMENTS

33

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4

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Published By Springer Netherlands

9789401076203, 9789400924826

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AlGaAs as a Dielectric on GaAs for Digital I.C.’s: Problems and Solutions

Semiconductor Device Reliability ◽

10.1007/978-94-009-2482-6_33 ◽

1990 ◽

pp. 557-568 ◽

Author(s):

W. Ted Masselink

Keyword(s):

Problems And Solutions

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Special Reliability Issues and Radiation Effects of High Speed I.C. s

Semiconductor Device Reliability ◽

10.1007/978-94-009-2482-6_31 ◽

1990 ◽

pp. 517-544

Author(s):

G. J. Papaioannou

Keyword(s):

Radiation Effects

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High Speed IC Reliability : Concerns and Advances

Semiconductor Device Reliability ◽

10.1007/978-94-009-2482-6_29 ◽

1990 ◽

pp. 491-506

Author(s):

A. A. Iliadis

Keyword(s):

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Temperature Distribution on GaAs MESFETs: Thermal Modeling and Experimental Results

Semiconductor Device Reliability ◽

10.1007/978-94-009-2482-6_28 ◽

1990 ◽

pp. 479-489

Author(s):

G. Clerico Titinet ◽

P. M. Scalafiotti

Keyword(s):

Temperature Distribution ◽

Thermal Modeling ◽

Experimental Results

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An Historical Perspective of GaAs Mesfet Reliability Work at Plessey

Semiconductor Device Reliability ◽

10.1007/978-94-009-2482-6_2 ◽

1990 ◽

pp. 29-42

Author(s):

James Turner ◽

Rodney Conlon

Keyword(s):

Historical Perspective ◽

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The Influence of Temperature and Use Conditions on the Degradation of Led Parameters

Semiconductor Device Reliability ◽

10.1007/978-94-009-2482-6_1 ◽

1990 ◽

pp. 1-28 ◽

Author(s):

R. Goarin ◽

J. P. Defars ◽

M. Robinet ◽

P. Durand ◽

B. Bauduin

Keyword(s):

Influence Of Temperature

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Optoelectronic Component Reliability and Failure Analysis

Semiconductor Device Reliability ◽

10.1007/978-94-009-2482-6_20 ◽

1990 ◽

pp. 353-362

Author(s):

P. Montangero

Keyword(s):

Failure Analysis ◽

Component Reliability ◽

Optoelectronic Component

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Computer-Aided Analysis of Integrated Circuit Reliability

Semiconductor Device Reliability ◽

10.1007/978-94-009-2482-6_7 ◽

1990 ◽

pp. 127-136 ◽

Author(s):

P. Mauri

Keyword(s):

Integrated Circuit ◽

Circuit Reliability ◽

Computer Aided Analysis ◽

Computer Aided ◽

Integrated Circuit Reliability

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Reliability of Short Channel Silicon and SOI VLSI Devices and Circuits

Semiconductor Device Reliability ◽

10.1007/978-94-009-2482-6_30 ◽

1990 ◽

pp. 507-516

Author(s):

Dimitris E. Ioannou

Keyword(s):

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Screening and burn-in: application to optoelectronic device selection for high-reliability S 280 optical submarine repeaters

Semiconductor Device Reliability ◽

10.1007/978-94-009-2482-6_3 ◽

1990 ◽

pp. 43-73

Author(s):

M. Gueguen ◽

J. L. Boussois ◽

J. L. Goudard ◽

D. Sauvage

Keyword(s):

High Reliability ◽

Optoelectronic Device ◽

Device Selection ◽

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