integrated circuit reliability Recently Published Documents

Diagnostic Capabilities

(Invited) Microwave-Based Metrology Platform Development: Application of Broad-Band RF Metrology to Integrated Circuit Reliability Analyses

ECS Transactions ◽

10.1149/06106.0113ecst ◽

2014 ◽

Vol 61 (6) ◽

pp. 113-121 ◽

Cited By ~ 4

Author(s):

L. You ◽

C. A. Okoro ◽

J.-J. Ahn ◽

J. J. Kopanski ◽

Y. S. Obeng

Keyword(s):

Integrated Circuit ◽

Broad Band ◽

Circuit Reliability ◽

Platform Development ◽

Development Application

(Invited) Microwave-Based Metrology Platform Development: Application of Broad-Band RF Metrology to Integrated Circuit Reliability Analyses

ECS Meeting Abstracts ◽

10.1149/ma2014-01/37/1415 ◽

2014 ◽

Keyword(s):

Integrated Circuit ◽

Broad Band ◽

Circuit Reliability ◽

Platform Development ◽

Development Application

Integrated Circuit Reliability

Analog IC Reliability in Nanometer CMOS ◽

10.1007/978-1-4614-6163-0_6 ◽

2013 ◽

pp. 151-180 ◽

Cited By ~ 1

Author(s):

Elie Maricau ◽

Georges Gielen

Keyword(s):

Integrated Circuit ◽

Circuit Reliability ◽

Integrated circuit reliability prediction based on physics-of-failure models in conjunction with field study

2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS) ◽

10.1109/rams.2013.6517737 ◽

2013 ◽

Cited By ~ 8

Author(s):

A. Hava ◽

Jin Qin ◽

J. B. Bernstein ◽

Y. Bot

Keyword(s):

Field Study ◽

Integrated Circuit ◽

Reliability Prediction ◽

Circuit Reliability ◽

Physics Of Failure ◽

Failure Models ◽

2011 Proceedings of the European Solid-State Device Research Conference (ESSDERC) ◽

A compact NBTI model for accurate analog integrated circuit reliability simulation

10.1109/essderc.2011.6044213 ◽

2011 ◽

Cited By ~ 12

Author(s):

Elie Maricau ◽

Leqi Zhang ◽

Jacopo Franco ◽

Philippe Roussel ◽

Guido Groeseneken ◽

...

Keyword(s):

Integrated Circuit ◽

Circuit Reliability ◽

Analog Integrated Circuit ◽

Predicting Integrated Circuit Reliability from Wafer Fabrication Technology Reliability Data

2007 International Symposium on Integrated Circuits ◽

10.1109/isicir.2007.4441849 ◽

2007 ◽

Cited By ~ 1

Author(s):

Cher Ming Tan ◽

FeiFei He

Keyword(s):

Integrated Circuit ◽

Wafer Fabrication ◽

Circuit Reliability ◽

Fabrication Technology ◽

Reliability Data ◽

Study of Area Scaling Effect on Integrated Circuit Reliability Based on Yield Models

Microelectronics Reliability ◽

10.1016/j.microrel.2005.07.011 ◽

2005 ◽

Vol 45 (9-11) ◽

pp. 1305-1310 ◽

Cited By ~ 8

Author(s):

Changsoo Hong ◽

Linda Milor ◽

Munkang Choi ◽

Tom Lin

Keyword(s):

Integrated Circuit ◽

Circuit Reliability ◽

Scaling Effect ◽

2001 6th International Conference on Solid-State and Integrated Circuit Technology. Proceedings (Cat. No.01EX443) ◽

An integrated-circuit reliability optimization simulator - XDRS

10.1109/icsict.2001.982064 ◽

2005 ◽

Author(s):

Liu Hongxia ◽

Hao Yue ◽

Sun Zhi

Keyword(s):

Integrated Circuit ◽

Reliability Optimization ◽

Circuit Reliability ◽

Deep Submicron CMOS Integrated Circuit Reliability Simulation with SPICE

Sixth International Symposium on Quality of Electronic Design (ISQED'05) ◽

10.1109/isqed.2005.37 ◽

2005 ◽

Cited By ~ 3

Author(s):

Xiaojun Li ◽

B. Huang ◽

J. Qin ◽

X. Zhang ◽

M. Talmor ◽

...

Keyword(s):

Integrated Circuit ◽

Deep Submicron ◽

Circuit Reliability ◽

Cmos Integrated Circuit ◽

Submicron Cmos