16th Asian Test Symposium (ATS 2007)
Latest Publications

TOTAL DOCUMENTS

214

(FIVE YEARS 0)

H-INDEX

10

(FIVE YEARS 0)

Published By IEEE

0769528902, 9780769528908

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

How the noise floor affects the production yield

16th Asian Test Symposium (ATS 2007) ◽

10.1109/ats.2007.4388058 ◽

2007 ◽

Author(s):

Akinori Maeda

Keyword(s):

Production Yield ◽

Noise Floor

Scan Diagnosis and Its Successful Industrial Applications

16th Asian Test Symposium (ATS 2007) ◽

10.1109/ats.2007.4388015 ◽

2007 ◽

Author(s):

Wu Yang ◽

Wu-Tung Cheng ◽

Yu Huang ◽

Martin Keim ◽

Randy Klingenberg

Keyword(s):

Industrial Applications

Keynote Speech 1: New Paths for Test

16th Asian Test Symposium (ATS 2007) ◽

10.1109/ats.2007.105 ◽

2007 ◽

Author(s):

Jacob Abraham

Keyword(s):

Keynote Speech

Symbolic Path Sensitization Analysis and Applications

16th Asian Test Symposium (ATS 2007) ◽

10.1109/ats.2007.21 ◽

2007 ◽

Author(s):

Jian Kang ◽

Sharad C. Seth ◽

Shashank K. Mehta

Keyword(s):

Path Sensitization

Test Generation for Timing-Critical Transition Faults

16th Asian Test Symposium (ATS 2007) ◽

10.1109/ats.2007.4388063 ◽

2007 ◽

Author(s):

Xijiang Lin ◽

Mark Kassab ◽

Janusz Rajski

Keyword(s):

Test Generation ◽

Critical Transition ◽

Transition Faults

Special Session: Analog Production Test

16th Asian Test Symposium (ATS 2007) ◽

10.1109/ats.2007.56 ◽

2007 ◽

Author(s):

Fidel Muradali ◽

Jochen Rivoir

Keyword(s):

Production Test ◽

Special Session

Improving Timing-Independent Testing of Crosstalk Using Realistic Assumptions on Delay Faults

16th Asian Test Symposium (ATS 2007) ◽

10.1109/ats.2007.4387983 ◽

2007 ◽

Author(s):

Shahdad Irajpour ◽

Sandeep K. Gupta ◽

Melvin A. Breuer

Keyword(s):

Delay Faults

Invited Talk 2: EDA to the Rescue of the Silicon Roadmap

16th Asian Test Symposium (ATS 2007) ◽

10.1109/ats.2007.108 ◽

2007 ◽

Author(s):

T. W. Williams

An Efficient Diagnostic Test Pattern Generation Framework Using Boolean Satisfiability

16th Asian Test Symposium (ATS 2007) ◽

10.1109/ats.2007.80 ◽

2007 ◽

Cited By ~ 21

Author(s):

Feijun Zheng ◽

Kwang-Ting Cheng ◽

Xiaolang Yan ◽

John Moondanos ◽

Ziyad Hanna

Keyword(s):

Diagnostic Test ◽

Test Pattern ◽

Boolean Satisfiability ◽

Pattern Generation ◽

Test Pattern Generation

Estimating the Fault Coverage of Functional Test Sequences Without Fault Simulation

16th Asian Test Symposium (ATS 2007) ◽

10.1109/ats.2007.18 ◽

2007 ◽

Cited By ~ 12

Author(s):

Irith Pomeranz ◽

Praveen K. Parvathala ◽

Srinivas Patil

Keyword(s):

Fault Simulation ◽

Fault Coverage ◽

Functional Test