16th Asian Test Symposium (ATS 2007)
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0769528902, 9780769528908
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Scan Diagnosis and Its Successful Industrial Applications

2007 ◽  
Author(s):  
Wu Yang ◽  
Wu-Tung Cheng ◽  
Yu Huang ◽  
Martin Keim ◽  
Randy Klingenberg
Keyword(s):  
Industrial Applications

scholarly journals Symbolic Path Sensitization Analysis and Applications

2007 ◽  
Author(s):  
Jian Kang ◽  
Sharad C. Seth ◽  
Shashank K. Mehta
Keyword(s):  
Path Sensitization

Test Generation for Timing-Critical Transition Faults

2007 ◽  
Author(s):  
Xijiang Lin ◽  
Mark Kassab ◽  
Janusz Rajski
Keyword(s):  
Test Generation ◽  
Critical Transition ◽  
Transition Faults

Special Session: Analog Production Test

2007 ◽  
Author(s):  
Fidel Muradali ◽  
Jochen Rivoir
Keyword(s):  
Production Test ◽  
Special Session

Improving Timing-Independent Testing of Crosstalk Using Realistic Assumptions on Delay Faults

2007 ◽  
Author(s):  
Shahdad Irajpour ◽  
Sandeep K. Gupta ◽  
Melvin A. Breuer
Keyword(s):  
Delay Faults

An Efficient Diagnostic Test Pattern Generation Framework Using Boolean Satisfiability

2007 ◽  
Author(s):  
Feijun Zheng ◽  
Kwang-Ting Cheng ◽  
Xiaolang Yan ◽  
John Moondanos ◽  
Ziyad Hanna
Keyword(s):  
Diagnostic Test ◽  
Test Pattern ◽  
Boolean Satisfiability ◽  
Pattern Generation ◽  
Test Pattern Generation
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