An Efficient Diagnostic Test Pattern Generation Framework Using Boolean Satisfiability

16th Asian Test Symposium (ATS 2007) ◽

10.1109/ats.2007.80 ◽

2007 ◽

Author(s):

Feijun Zheng ◽

Kwang-Ting Cheng ◽

Xiaolang Yan ◽

John Moondanos ◽

Ziyad Hanna

Keyword(s):

Diagnostic Test ◽

Test Pattern ◽

Boolean Satisfiability ◽

Pattern Generation ◽

Test Pattern Generation

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An Efficient Diagnostic Test Pattern Generation Framework Using Boolean Satisfiability

16th Asian Test Symposium (ATS 2007) ◽

10.1109/ats.2007.4388027 ◽

2007 ◽

Author(s):

Feijun Zheng ◽

Kwang-Ting Cheng ◽

Xiaolang Yan ◽

John Moondanos ◽

Ziyad Hanna

Keyword(s):

Diagnostic Test ◽

Test Pattern ◽

Boolean Satisfiability ◽

Pattern Generation ◽

Test Pattern Generation

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Multiple-fault diagnosis based on adaptive diagnostic test pattern generation

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2007.8361586 ◽

2007 ◽

Vol 26 (5) ◽

pp. 932-942

Author(s):

Yung-Chieh Lin ◽

Feng Lu ◽

Kwang-Ting Cheng

Keyword(s):

Fault Diagnosis ◽

Diagnostic Test ◽

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Multiple Fault ◽

Multiple Fault Diagnosis

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A diagnostic test pattern generation algorithm

Proceedings. International Test Conference 1990 ◽

10.1109/test.1990.114000 ◽

2002 ◽

Author(s):

P. Camurati ◽

D. Medina ◽

P. Prinetto ◽

M. Sonza Reorda

Keyword(s):

Diagnostic Test ◽

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Generation Algorithm

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Parallel test pattern generation using Boolean satisfiability

[1991] Proceedings. Fourth CSI/IEEE International Symposium on VLSI Design ◽

10.1109/isvd.1991.185095 ◽

1991 ◽

Author(s):

V. Sivaramakrishnan ◽

S.C. Seth ◽

P. Agrawal

Keyword(s):

Test Pattern ◽

Boolean Satisfiability ◽

Pattern Generation ◽

Test Pattern Generation ◽

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GA based diagnostic test pattern generation for transition faults

2015 19th International Symposium on VLSI Design and Test ◽

10.1109/isvdat.2015.7208122 ◽

2015 ◽

Author(s):

Anupam Bhar ◽

Santanu Chattopadhyay ◽

Indranil Sengupta ◽

Rohit Kapur

Keyword(s):

Diagnostic Test ◽

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Transition Faults

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High Quality Test Pattern Generation and Boolean Satisfiability

10.1007/978-1-4419-9976-4 ◽

2012 ◽

Author(s):

Stephan Eggersglüß ◽

Rolf Drechsler

Keyword(s):

Test Pattern ◽

Boolean Satisfiability ◽

Pattern Generation ◽

Test Pattern Generation ◽

Quality Test ◽

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Dynamic fault collapsing and diagnostic test pattern generation for sequential circuits

1998 IEEE/ACM International Conference on Computer-Aided Design. Digest of Technical Papers (IEEE Cat. No.98CB36287) ◽

10.1109/iccad.1998.742865 ◽

2002 ◽

Author(s):

V. Boppana ◽

I.K. Fuchs

Keyword(s):

Diagnostic Test ◽

Test Pattern ◽

Sequential Circuits ◽

Pattern Generation ◽

Test Pattern Generation

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Test Pattern Generation for Approximate Circuits Based on Boolean Satisfiability

2019 Design, Automation & Test in Europe Conference & Exhibition (DATE) ◽

10.23919/date.2019.8714898 ◽

2019 ◽

Author(s):

Anteneh Gebregiorgis ◽

Mehdi B. Tahoori

Keyword(s):

Test Pattern ◽

Boolean Satisfiability ◽

Pattern Generation ◽

Test Pattern Generation

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Test pattern generation using Boolean satisfiability

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/43.108614 ◽

1992 ◽

Vol 11 (1) ◽

pp. 4-15 ◽

Author(s):

T. Larrabee

Keyword(s):

Test Pattern ◽

Boolean Satisfiability ◽

Pattern Generation ◽

Test Pattern Generation

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Diagnostic test-pattern generation targeting open-segment defects and its diagnosis flow

IET Computers & Digital Techniques ◽

10.1049/iet-cdt.2011.0121 ◽

2012 ◽

Vol 6 (3) ◽

pp. 186 ◽

Author(s):

Y.-H. Chen ◽

C.-L. Chang ◽

C.H.-P. Wen

Keyword(s):

Diagnostic Test ◽

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

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