2017 22nd IEEE European Test Symposium (ETS)
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49
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Published By IEEE

9781509054572
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Best paper

2017 ◽  
Author(s):  
Bernd Becker ◽  
Adit Singh

[Title page]

2017 ◽  
Keyword(s):  
Title Page

A phase locking test solution for MEMS devices

2017 ◽  
Author(s):  
Tareq Muhammad Supon ◽  
Rashid Rashidzadeh
Keyword(s):  
Phase Locking ◽  
Test Solution ◽  
Mems Devices

Data-driven fault diagnosis with missing syndromes imputation for functional test through conditional specification

2017 ◽  
Author(s):  
Tong Guan ◽  
Zhaobo Zhang ◽  
Wen Dong ◽  
Chunming Qiao ◽  
Xinli Gu
Keyword(s):  
Fault Diagnosis ◽  
Functional Test ◽  
Data Driven ◽  
Conditional Specification

An efficient test technique to prevent scan-based side-channel attacks

2017 ◽  
Author(s):  
Satyadev Ahlawat ◽  
Darshit Vaghani ◽  
Virendra Singh
Keyword(s):  
Side Channel ◽  
Side Channel Attacks ◽  
Test Technique ◽  
Efficient Test

Rout3D: A lightweight adaptive routing algorithm for tolerating faulty vertical links in 3D-NoCs

2017 ◽  
Author(s):  
Amir Charif ◽  
Nacer-Eddine Zergainoh ◽  
Alexandre Coelho ◽  
Michael Nicolaidis
Keyword(s):  
Routing Algorithm ◽  
Adaptive Routing

Counteracting malicious faults in cryptographic circuits

2017 ◽  
Author(s):  
Ilia Polian ◽  
Francesco Regazzoni

Foreword

2017 ◽  
Author(s):  
Maria K. Michael ◽  
Rolf Drechsler ◽  
Stephan Eggersgluss ◽  
Haralampos-G. Stratigopoulos ◽  
Sybille Hellebrand ◽  
...  
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