2017 22nd IEEE European Test Symposium (ETS)
Latest Publications

TOTAL DOCUMENTS

49

(FIVE YEARS 0)

H-INDEX

5

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Published By IEEE

9781509054572

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

[Copyright notice]

2017 22nd IEEE European Test Symposium (ETS) ◽

10.1109/ets.2017.7968203 ◽

2017 ◽

Keyword(s):

Copyright Notice

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A phase locking test solution for MEMS devices

2017 22nd IEEE European Test Symposium (ETS) ◽

10.1109/ets.2017.7968236 ◽

2017 ◽

Author(s):

Tareq Muhammad Supon ◽

Rashid Rashidzadeh

Keyword(s):

Phase Locking ◽

Test Solution ◽

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Best paper

2017 22nd IEEE European Test Symposium (ETS) ◽

10.1109/ets.2017.7968207 ◽

2017 ◽

Author(s):

Bernd Becker ◽

Adit Singh

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[Title page]

2017 22nd IEEE European Test Symposium (ETS) ◽

10.1109/ets.2017.7968200 ◽

2017 ◽

Keyword(s):

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An efficient test technique to prevent scan-based side-channel attacks

2017 22nd IEEE European Test Symposium (ETS) ◽

10.1109/ets.2017.7968241 ◽

2017 ◽

Author(s):

Satyadev Ahlawat ◽

Darshit Vaghani ◽

Virendra Singh

Keyword(s):

Side Channel ◽

Side Channel Attacks ◽

Test Technique ◽

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Data-driven fault diagnosis with missing syndromes imputation for functional test through conditional specification

2017 22nd IEEE European Test Symposium (ETS) ◽

10.1109/ets.2017.7968232 ◽

2017 ◽

Author(s):

Tong Guan ◽

Zhaobo Zhang ◽

Wen Dong ◽

Chunming Qiao ◽

Xinli Gu

Keyword(s):

Fault Diagnosis ◽

Functional Test ◽

Data Driven ◽

Conditional Specification

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SIC pair generation in optimal time using rotatable counters

2017 22nd IEEE European Test Symposium (ETS) ◽

10.1109/ets.2017.7968240 ◽

2017 ◽

Author(s):

Ioannis Voyiatzis

Keyword(s):

Optimal Time ◽

Pair Generation

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Rout3D: A lightweight adaptive routing algorithm for tolerating faulty vertical links in 3D-NoCs

2017 22nd IEEE European Test Symposium (ETS) ◽

10.1109/ets.2017.7968219 ◽

2017 ◽

Author(s):

Amir Charif ◽

Nacer-Eddine Zergainoh ◽

Alexandre Coelho ◽

Michael Nicolaidis

Keyword(s):

Routing Algorithm ◽

Adaptive Routing

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Counteracting malicious faults in cryptographic circuits

2017 22nd IEEE European Test Symposium (ETS) ◽

10.1109/ets.2017.7968230 ◽

2017 ◽

Author(s):

Ilia Polian ◽

Francesco Regazzoni

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Foreword

2017 22nd IEEE European Test Symposium (ETS) ◽

10.1109/ets.2017.7968204 ◽

2017 ◽

Author(s):

Maria K. Michael ◽

Rolf Drechsler ◽

Stephan Eggersgluss ◽

Haralampos-G. Stratigopoulos ◽

Sybille Hellebrand ◽

...

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