2021 IEEE 39th VLSI Test Symposium (VTS)
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9781665419499
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Special Session: Physical Attacks through the Chip Backside: Threats, Challenges, and Opportunities

2021 ◽  
Author(s):  
Elham Amini ◽  
Kai Bartels ◽  
Christian Boit ◽  
Marius Eggert ◽  
Norbert Herfurth ◽  
...  
Keyword(s):  
Special Session ◽  
Challenges And Opportunities

On Workload-Aware DRAM Failure Prediction in Large-Scale Data Centers

2021 ◽  
Author(s):  
Xingyi Wang ◽  
Yu Li ◽  
Yiquan Chen ◽  
Shiwen Wang ◽  
Yin Du ◽  
...  
Keyword(s):  
Large Scale ◽  
Data Centers ◽  
Failure Prediction ◽  
Large Scale Data ◽  
Scale Data

Deep Stalling using a Coverage Driven Genetic Algorithm Framework

2021 ◽  
Author(s):  
Siddhanth Dhodhi ◽  
Debarshi Chatterjee ◽  
Eric Hill ◽  
Saad Godil
Keyword(s):  
Genetic Algorithm ◽  
Algorithm Framework

Two Pattern Timing Tests Capturing Defect-Induced Multi-Gate Delay Impact of Shorts

2021 ◽  
Author(s):  
Sujay Pandey ◽  
Zhiwei Liao ◽  
Shreyas Nandi ◽  
Suriyaprakash Natarajan ◽  
Arani Sinha ◽  
...  
Keyword(s):  
Gate Delay
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