Proceedings 1988 IEEE International Conference on Computer Design: VLSI
Latest Publications

TOTAL DOCUMENTS

125

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H-INDEX

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Published By IEEE Comput. Soc. Press

0818608722

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Parallel decomposition of multipliers modulo (2/sup n/+or-1)

Proceedings 1988 IEEE International Conference on Computer Design: VLSI ◽

10.1109/iccd.1988.25751 ◽

2003 ◽

Cited By ~ 6

Author(s):

A. Skavantzos ◽

F.J. Taylor

Keyword(s):

Parallel Decomposition

The KARL/KARATE system-integrating functional test development into a CAD environment for VLSI

Proceedings 1988 IEEE International Conference on Computer Design: VLSI ◽

10.1109/iccd.1988.25692 ◽

2003 ◽

Cited By ~ 1

Author(s):

G. Alfs ◽

R.W. Hartenstein ◽

A. Wodtko

Keyword(s):

Test Development ◽

Functional Test

Current sensing for built-in testing of CMOS circuits

Proceedings 1988 IEEE International Conference on Computer Design: VLSI ◽

10.1109/iccd.1988.25742 ◽

2003 ◽

Cited By ~ 58

Author(s):

D.B.I. Feltham ◽

P.J. Nigh ◽

L.R. Carley ◽

W. Maly

Keyword(s):

Cmos Circuits ◽

Current Sensing

Free-space optical crossover interconnects for parallel computers

Proceedings 1988 IEEE International Conference on Computer Design: VLSI ◽

10.1109/iccd.1988.25666 ◽

2003 ◽

Cited By ~ 1

Author(s):

J. Jahns

Keyword(s):

Free Space ◽

Parallel Computers ◽

Free Space Optical

MILES: a mixed level simulator for analog/digital design

Proceedings 1988 IEEE International Conference on Computer Design: VLSI ◽

10.1109/iccd.1988.25674 ◽

2003 ◽

Cited By ~ 1

Author(s):

A.C.J. Stroucken ◽

G.J.J.M. van de Ven

Keyword(s):

Digital Design

Multi-chip packaging for high performance systems

Proceedings 1988 IEEE International Conference on Computer Design: VLSI ◽

10.1109/iccd.1988.25663 ◽

2003 ◽

Author(s):

C.C. Chao ◽

K.H. Chen ◽

R. Kaw ◽

J. Leibovitz ◽

V.K. Nagesh ◽

...

Keyword(s):

High Performance ◽

High Performance Systems

EXIST: an interactive VLSI architectural environment

Proceedings 1988 IEEE International Conference on Computer Design: VLSI ◽

10.1109/iccd.1988.25713 ◽

2003 ◽

Cited By ~ 2

Author(s):

P.S. van der Meulen ◽

M.-D. Huang ◽

U. Bar-Gadda ◽

E. Lee ◽

P. Baltus

The BACK algorithm for sequential test generation

Proceedings 1988 IEEE International Conference on Computer Design: VLSI ◽

10.1109/iccd.1988.25661 ◽

2003 ◽

Cited By ~ 127

Author(s):

W.-T. Cheng

Keyword(s):

Test Generation ◽

Sequential Test

Object relocation in OX

Proceedings 1988 IEEE International Conference on Computer Design: VLSI ◽

10.1109/iccd.1988.25648 ◽

2003 ◽

Author(s):

J.H. Kukula

Random testability analysis: comparing and evaluating existing approaches

Proceedings 1988 IEEE International Conference on Computer Design: VLSI ◽

10.1109/iccd.1988.25662 ◽

2003 ◽

Cited By ~ 6

Author(s):

P. Camurati ◽

P. Prinetto ◽

M.S. Reorda

Keyword(s):

Testability Analysis

Proceedings 1988 IEEE International Conference on Computer Design: VLSILatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE Comput. Soc. Press

Parallel decomposition of multipliers modulo (2/sup n/+or-1)

The KARL/KARATE system-integrating functional test development into a CAD environment for VLSI

Current sensing for built-in testing of CMOS circuits

Free-space optical crossover interconnects for parallel computers

MILES: a mixed level simulator for analog/digital design

Multi-chip packaging for high performance systems

EXIST: an interactive VLSI architectural environment

The BACK algorithm for sequential test generation

Object relocation in OX

Random testability analysis: comparing and evaluating existing approaches

Proceedings 1988 IEEE International Conference on Computer Design: VLSI
Latest Publications