2019 IEEE/ACM 4th International Workshop on Metamorphic Testing (MET)
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9781728122359

Author(s):  
Stevao Alves de Andrade ◽  
Italo Santos ◽  
Claudinei Brito Junior ◽  
Misael Junior ◽  
Simone R.S. de Souza ◽  
...  

Author(s):  
Owen Johnston ◽  
Darryl Jarman ◽  
Jeffrey Berry ◽  
Zhi Quan Zhou ◽  
Tsong Yueh Chen

Author(s):  
Anurag Dwarakanath ◽  
Manish Ahuja ◽  
Sanjay Podder ◽  
Silja Vinu ◽  
Arijit Naskar ◽  
...  

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