2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.00TH8527)

Single event transient (SET) sensitivity of radiation hardened and COTS voltage comparators

2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.00TH8527) ◽

10.1109/redw.2000.896269 ◽

2002 ◽

Cited By ~ 20

Author(s):

R. Koga ◽

S.H. Crain ◽

K.B. Crawford ◽

S.C. Moss ◽

S.D. LaLumondiere ◽

...

Keyword(s):

Single Event ◽

Single Event Transient ◽

Radiation Hardened

Radiation damage and single event effect results for candidate spacecraft electronics

2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.00TH8527) ◽

10.1109/redw.2000.896279 ◽

2002 ◽

Cited By ~ 10

Author(s):

M.V. O'Bryan ◽

K.A. LaBel ◽

R.A. Reed ◽

J.W. Howard ◽

R.L. Ladbury ◽

...

Keyword(s):

Radiation Damage ◽

Single Event ◽

Single Event Effect

A compendium of recent optocoupler radiation test data

2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.00TH8527) ◽

10.1109/redw.2000.896280 ◽

2002 ◽

Cited By ~ 20

Author(s):

K.A. LaBel ◽

S.D. Kniffin ◽

R.A. Reed ◽

H.S. Kim ◽

J.L. Wert ◽

...

Keyword(s):

Test Data ◽

Radiation Test

Dose rate and bias dependency of total dose sensitivity of low dropout voltage regulators

2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.00TH8527) ◽

10.1109/redw.2000.896278 ◽

2002 ◽

Cited By ~ 15

Author(s):

S.S. McClure ◽

J.L. Gorelick ◽

R. Pease ◽

A.H. Johnston

Keyword(s):

Total Dose ◽

Dose Rate ◽

Voltage Regulators ◽

Dose Sensitivity

Single event effects and total ionizing dose results of a low voltage EEPROM

2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.00TH8527) ◽

10.1109/redw.2000.896271 ◽

2002 ◽

Cited By ~ 14

Author(s):

D. Krawzsenek ◽

P. Hsu ◽

H. Anthony ◽

C. Land

Keyword(s):

Low Voltage ◽

Single Event ◽

Total Ionizing Dose ◽

Single Event Effects

Destructive heavy ion SEE investigation of 3 IGBT devices

2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.00TH8527) ◽

10.1109/redw.2000.896262 ◽

2002 ◽

Cited By ~ 1

Author(s):

P.T. McDonald ◽

B.G. Henson ◽

W.J. Stapor ◽

M. Harris

Keyword(s):

Heavy Ion

SEU and TID testing of the Samsung 128 Mbit and the Toshiba 256 Mbit flash memory

2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.00TH8527) ◽

10.1109/redw.2000.896277 ◽

2002 ◽

Cited By ~ 33

Author(s):

D.R. Roth ◽

J.D. Kinnison ◽

B.G. Carkhuff ◽

J.R. Lander ◽

G.S. Bognaski ◽

...

Keyword(s):

Flash Memory

Management of radiation issues for using commercial non-hardened parts on the INTEGRAL Spectrometer project

2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.00TH8527) ◽

10.1109/redw.2000.896272 ◽

2002 ◽

Cited By ~ 4

Author(s):

E. Vergnault ◽

R. Ecoffet ◽

R. Millot ◽

S. Duzellier ◽

L. Guibert ◽

...

Co-60 total dose test of 14- and 16-bit ADCs

2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.00TH8527) ◽

10.1109/redw.2000.896265 ◽

2002 ◽

Cited By ~ 3

Author(s):

G. Tomasch ◽

R. Harboe-Sorensen ◽

R. Muller ◽

T. Tzscheetzsch

Keyword(s):

Total Dose

Operation of the TRIUMF (20-500 MeV) proton irradiation facility

2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.00TH8527) ◽

10.1109/redw.2000.896260 ◽

2002 ◽

Cited By ~ 48

Author(s):

E.W. Blackmore

Keyword(s):

Proton Irradiation

2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.00TH8527)
Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Single event transient (SET) sensitivity of radiation hardened and COTS voltage comparators

Radiation damage and single event effect results for candidate spacecraft electronics

A compendium of recent optocoupler radiation test data

Dose rate and bias dependency of total dose sensitivity of low dropout voltage regulators

Single event effects and total ionizing dose results of a low voltage EEPROM

Destructive heavy ion SEE investigation of 3 IGBT devices

SEU and TID testing of the Samsung 128 Mbit and the Toshiba 256 Mbit flash memory

Management of radiation issues for using commercial non-hardened parts on the INTEGRAL Spectrometer project

Co-60 total dose test of 14- and 16-bit ADCs

Operation of the TRIUMF (20-500 MeV) proton irradiation facility

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2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.00TH8527)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Single event transient (SET) sensitivity of radiation hardened and COTS voltage comparators

Radiation damage and single event effect results for candidate spacecraft electronics

A compendium of recent optocoupler radiation test data

Dose rate and bias dependency of total dose sensitivity of low dropout voltage regulators

Single event effects and total ionizing dose results of a low voltage EEPROM

Destructive heavy ion SEE investigation of 3 IGBT devices

SEU and TID testing of the Samsung 128 Mbit and the Toshiba 256 Mbit flash memory

Management of radiation issues for using commercial non-hardened parts on the INTEGRAL Spectrometer project

Co-60 total dose test of 14- and 16-bit ADCs

Operation of the TRIUMF (20-500 MeV) proton irradiation facility

2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.00TH8527)
Latest Publications