Optical Metrology and Inspection for Industrial Applications V
Latest Publications

TOTAL DOCUMENTS

59

(FIVE YEARS 2)

H-INDEX

1

(FIVE YEARS 0)

Published By SPIE

9781510622364, 9781510622371

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Design of subwavelength grating polarizers to generate cylindrical vector beams

Optical Metrology and Inspection for Industrial Applications V ◽

10.1117/12.2501236 ◽

2019 ◽

Author(s):

Guozun Zhou ◽

Weijian Tian

Keyword(s):

Subwavelength Grating ◽

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Robust direct vision-based pose tracking using normalized mutual information (Addendum)

Optical Metrology and Inspection for Industrial Applications V ◽

10.1117/12.2534586 ◽

2019 ◽

Author(s):

Hang Luo ◽

Christian Pape ◽

Eduard Reithmeier

Keyword(s):

Mutual Information ◽

Direct Vision ◽

Normalized Mutual Information ◽

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Research on the displacement characteristic of piezoelectric transducer

Optical Metrology and Inspection for Industrial Applications V ◽

10.1117/12.2505462 ◽

2018 ◽

Author(s):

Sen Han ◽

Fang Wang ◽

Xin Huang ◽

Qingjie Lu ◽

Bo Zhang ◽

...

Keyword(s):

Piezoelectric Transducer

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Front Matter: Volume 10819

Optical Metrology and Inspection for Industrial Applications V ◽

10.1117/12.2521846 ◽

2018 ◽

Keyword(s):

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Multi-ring artifact for performance evaluation experiments on probing system combinations

Optical Metrology and Inspection for Industrial Applications V ◽

10.1117/12.2323647 ◽

2018 ◽

Author(s):

Sen Zhou ◽

Jian Xu ◽

Lei Tao ◽

Long Wang ◽

Yan Yu ◽

...

Keyword(s):

Performance Evaluation ◽

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Advanced signal processing in a white-light scanning interferometer for exact surface profile measurement

Optical Metrology and Inspection for Industrial Applications V ◽

10.1117/12.2502790 ◽

2018 ◽

Author(s):

Songjie Luo ◽

Osami Sasaki ◽

Samuel Choi ◽

Takamasa Suzuki ◽

Jixiong Pu

Keyword(s):

Signal Processing ◽

White Light ◽

Surface Profile ◽

Profile Measurement ◽

Scanning Interferometer ◽

Surface Profile Measurement

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Spectral-domain optical coherence tomography for conformal coating thickness measurement on printed circuit board

Optical Metrology and Inspection for Industrial Applications V ◽

10.1117/12.2502193 ◽

2018 ◽

Author(s):

Xiao Shao ◽

Xiaojun Yu ◽

Xinjian Chen ◽

Jianhua Mo ◽

Linbo Liu ◽

...

Keyword(s):

Optical Coherence Tomography ◽

Coating Thickness ◽

Printed Circuit Board ◽

Thickness Measurement ◽

Circuit Board ◽

Spectral Domain ◽

Optical Coherence ◽

Conformal Coating ◽

Printed Circuit ◽

Coating Thickness Measurement

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AM0 performance measurement of triple-junction GaInP/InGaAs/Ge solar cells by a compound light source

Optical Metrology and Inspection for Industrial Applications V ◽

10.1117/12.2502513 ◽

2018 ◽

Author(s):

Haifeng Meng ◽

Limin Xiong ◽

Junchao Zhang ◽

Yingwei He ◽

Bifeng Zhang ◽

...

Keyword(s):

Solar Cells ◽

Performance Measurement ◽

Light Source ◽

Triple Junction

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Holistic dimensional measurement of sheet-bulk metal formed parts

Optical Metrology and Inspection for Industrial Applications V ◽

10.1117/12.2501255 ◽

2018 ◽

Author(s):

Sebastian Metzner ◽

Tino Hausotte

Keyword(s):

Dimensional Measurement

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Ambient aerosols identification based on polarization indices during a field test

Optical Metrology and Inspection for Industrial Applications V ◽

10.1117/12.2501101 ◽

2018 ◽

Author(s):

Nan Zeng ◽

Sirui Chen ◽

Dongjian Zhan ◽

Yonghong He ◽

Hui Ma

Keyword(s):

Ambient Aerosols

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