Modern Developments and Applications in Microbeam Analysis
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Published By Springer Vienna

9783211831069, 9783709175064
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EPMA Studies of the Growth of Thin Surface Coatings Produced by Evaporation

1998 ◽  
pp. 171-176
Author(s):  
Hildegard Hammer ◽  
Sabine Kulow ◽  
Christine Schmidt ◽  
Gerhard Schmidt ◽  
Peter Zanel
Keyword(s):  
Surface Coatings

Quantitative EDS Analysis of SiO2/Al2O3/TiO2 Multilayer Films

1998 ◽  
pp. 149-154
Author(s):  
David G. Rickerby ◽  
Norbert Wächter ◽  
Rudolf Reichelt
Keyword(s):  
Multilayer Films ◽  
Eds Analysis

Analysis of Thin Films with Slightly Rough Boundaries

1998 ◽  
pp. 177-180
Author(s):  
Ivan Ohlídal ◽  
Daniel Franta ◽  
Jaroslav Hora ◽  
Karel Navrátil ◽  
Jan Weber ◽  
...  
Keyword(s):  
Thin Films ◽  
Rough Boundaries

On the Spatial Resolution in Analytical Electron Microscopy

1998 ◽  
pp. 59-64
Author(s):  
Aldo Armigliato ◽  
David J. Howard ◽  
Roberto Balboni ◽  
Stefano Frabboni ◽  
Matty R. Caymax
Keyword(s):  
Electron Microscopy ◽  
Spatial Resolution ◽  
Analytical Electron Microscopy ◽  
Analytical Electron
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