12th IEEE International On-Line Testing Symposium (IOLTS'06)
Latest Publications

TOTAL DOCUMENTS

66

(FIVE YEARS 0)

H-INDEX

14

(FIVE YEARS 0)

Published By IEEE

0769526209

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Checker No-Harm Alarm Robustness

12th IEEE International On-Line Testing Symposium (IOLTS'06) ◽

10.1109/iolts.2006.16 ◽

2006 ◽

Author(s):

D. Rossi ◽

M. Omana ◽

C. Metra ◽

A. Pagni

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Trend in DRAM Soft Errors

12th IEEE International On-Line Testing Symposium (IOLTS'06) ◽

10.1109/iolts.2006.63 ◽

2006 ◽

Author(s):

G. Schindlbeck

Keyword(s):

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Combinational Logic Soft Error Analysis and Protection

12th IEEE International On-Line Testing Symposium (IOLTS'06) ◽

10.1109/iolts.2006.17 ◽

2006 ◽

Author(s):

A.K. Nieuwland ◽

S. Jasarevic ◽

G. Jerin

Keyword(s):

Error Analysis ◽

Combinational Logic

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Emulation-based Fault Injection in Circuits with Embedded Memories

12th IEEE International On-Line Testing Symposium (IOLTS'06) ◽

10.1109/iolts.2006.29 ◽

2006 ◽

Author(s):

M. Garcia-Valderas ◽

M. Portela-Garcia ◽

C. Lopez-Ongil ◽

L. Entrena

Keyword(s):

Fault Injection ◽

Embedded Memories

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Designing Robust Checkers in the Presence of Massive Timing Errors

12th IEEE International On-Line Testing Symposium (IOLTS'06) ◽

10.1109/iolts.2006.22 ◽

2006 ◽

Author(s):

F. Worm ◽

P. Thiran ◽

P. Ienne

Keyword(s):

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Diophantine-Equation Based Arithmetic Test Set Embedding

12th IEEE International On-Line Testing Symposium (IOLTS'06) ◽

10.1109/iolts.2006.23 ◽

2006 ◽

Author(s):

D. Nikolos ◽

D. Kagaris ◽

S. Gidaros

Keyword(s):

Diophantine Equation ◽

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Evaluating One-Hot Encoding Finite State Machines for SEU Reliability in SRAM-based FPGAs

12th IEEE International On-Line Testing Symposium (IOLTS'06) ◽

10.1109/iolts.2006.32 ◽

2006 ◽

Author(s):

M. Cassel ◽

F.L. Kastensmidt

Keyword(s):

Finite State Machines ◽

State Machines ◽

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Practical Evaluation of Fault Countermeasures on an Asynchronous DES Crypto Processor

12th IEEE International On-Line Testing Symposium (IOLTS'06) ◽

10.1109/iolts.2006.50 ◽

2006 ◽

Author(s):

Y. Monnet ◽

M. Renaudin ◽

R. Leveugle ◽

N. Feyt ◽

P. Moitrel ◽

...

Keyword(s):

Practical Evaluation

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Dynamic Fault Detection in Digital Systems Using Dynamic Voltage Scaling and Multi-Temperature Schemes

12th IEEE International On-Line Testing Symposium (IOLTS'06) ◽

10.1109/iolts.2006.25 ◽

2006 ◽

Author(s):

M. Rodriguez-Irago ◽

J.J.R. Andina ◽

F. Vargas ◽

J. Semiao ◽

I.C. Teixeira ◽

...

Keyword(s):

Fault Detection ◽

Voltage Scaling ◽

Dynamic Voltage Scaling ◽

Digital Systems ◽

Dynamic Voltage

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DMT and DT2: Two Fault-Tolerant Architectures developed by CNES for COTs-based Spacecraft Supercomputers

12th IEEE International On-Line Testing Symposium (IOLTS'06) ◽

10.1109/iolts.2006.24 ◽

2006 ◽

Author(s):

M.P. Pignol

Keyword(s):

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