Materials and Reliability Handbook for Semiconductor Optical and Electron Devices
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Published By Springer New York

9781461443360, 9781461443377

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Reliability and Degradation of III-V Optical Devices Focusing on Gradual Degradation

Materials and Reliability Handbook for Semiconductor Optical and Electron Devices ◽

10.1007/978-1-4614-4337-7_4 ◽

2012 ◽

pp. 87-122 ◽

Author(s):

Osamu Ueda

Keyword(s):

Optical Devices

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InGaN Laser Diode Degradation

Materials and Reliability Handbook for Semiconductor Optical and Electron Devices ◽

10.1007/978-1-4614-4337-7_8 ◽

2012 ◽

pp. 247-261

Author(s):

Piotr Perlin ◽

Łucja Marona

Keyword(s):

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Structural Defects in GaN-Based Materials and Their Relation to GaN-Based Laser Diodes

Materials and Reliability Handbook for Semiconductor Optical and Electron Devices ◽

10.1007/978-1-4614-4337-7_7 ◽

2012 ◽

pp. 207-245 ◽

Author(s):

Shigetaka Tomiya

Keyword(s):

Laser Diodes ◽

Structural Defects

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Novel Dielectrics for GaN Device Passivation and Improved Reliability

Materials and Reliability Handbook for Semiconductor Optical and Electron Devices ◽

10.1007/978-1-4614-4337-7_15 ◽

2012 ◽

pp. 475-513

Author(s):

F. Ren ◽

Stephen J. Pearton ◽

B. P. Gila ◽

C. R. Abernathy ◽

R. C. Fitch

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Catastrophic Optical Damage in High-Power, Broad-Area Laser Diodes

Materials and Reliability Handbook for Semiconductor Optical and Electron Devices ◽

10.1007/978-1-4614-4337-7_5 ◽

2012 ◽

pp. 123-145

Author(s):

Aland K. Chin ◽

Rick K. Bertaska

Keyword(s):

Laser Diodes ◽

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Strain Effects in AlGaN/GaN HEMTs

Materials and Reliability Handbook for Semiconductor Optical and Electron Devices ◽

10.1007/978-1-4614-4337-7_12 ◽

2012 ◽

pp. 381-429 ◽

Author(s):

Min Chu ◽

Andrew D. Koehler ◽

Amit Gupta ◽

Srivatsan Parthasarathy ◽

Mehmet Onur Baykan ◽

...

Keyword(s):

Strain Effects ◽

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Reliability Study of InP-Based HBTs Operating at High Current Density

Materials and Reliability Handbook for Semiconductor Optical and Electron Devices ◽

10.1007/978-1-4614-4337-7_18 ◽

2012 ◽

pp. 583-610 ◽

Author(s):

Yoshino K. Fukai ◽

Kenji Kurishima

Keyword(s):

Current Density ◽

High Current Density ◽

High Current ◽

Reliability Study

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Failure Analysis of Semiconductor Optical Devices

Materials and Reliability Handbook for Semiconductor Optical and Electron Devices ◽

10.1007/978-1-4614-4337-7_2 ◽

2012 ◽

pp. 19-53 ◽

Author(s):

Osamu Ueda ◽

Robert W. Herrick

Keyword(s):

Failure Analysis ◽

Optical Devices

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Reliability Studies in the Real World

Materials and Reliability Handbook for Semiconductor Optical and Electron Devices ◽

10.1007/978-1-4614-4337-7_11 ◽

2012 ◽

pp. 319-379

Author(s):

William J. Roesch

Keyword(s):

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Mechanism of Defect Reactions in Semiconductors

Materials and Reliability Handbook for Semiconductor Optical and Electron Devices ◽

10.1007/978-1-4614-4337-7_10 ◽

2012 ◽

pp. 283-316

Author(s):

Yuzo Shinozuka

Keyword(s):

Defect Reactions

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