Noncontact Atomic Force Microscopy - NanoScience and Technology
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Published By Springer International Publishing

9783319155876, 9783319155883
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Atomic-Scale Contrast Formation in AFM Images on Molecular Systems

2015 ◽  
pp. 173-194 ◽  
Author(s):  
Fabian Schulz ◽  
Sampsa Hämäläinen ◽  
Peter Liljeroth
Keyword(s):  
Atomic Scale ◽  
Molecular Systems

Mechanochemistry at Silicon Surfaces

2015 ◽  
pp. 247-274
Author(s):  
Adam Sweetman ◽  
Samuel Paul Jarvis ◽  
Philip Moriarty
Keyword(s):  
Silicon Surfaces

Single Molecule Force Spectroscopy

2015 ◽  
pp. 195-222
Author(s):  
Rémy Pawlak ◽  
Shigeki Kawai ◽  
Thilo Glatzel ◽  
Ernst Meyer
Keyword(s):  
Single Molecule ◽  
Force Spectroscopy ◽  
Single Molecule Force Spectroscopy

Self-assembly of Organic Molecules on Insulating Surfaces

2015 ◽  
pp. 147-171 ◽  
Author(s):  
Felix Kling ◽  
Ralf Bechstein ◽  
Philipp Rahe ◽  
Angelika Kühnle
Keyword(s):  
Self Assembly ◽  
Organic Molecules ◽  
Insulating Surfaces

Introduction

2015 ◽  
pp. 1-8 ◽  
Author(s):  
Seizo Morita

The Phantom Force

2015 ◽  
pp. 71-92 ◽  
Author(s):  
Alfred John Weymouth ◽  
Franz J. Giessibl

Manipulation and Spectroscopy Using AFM/STM at Room Temperature

2015 ◽  
pp. 51-69
Author(s):  
Masayuki Abe ◽  
Yoshiaki Sugimoto ◽  
Seizo Morita
Keyword(s):  
Room Temperature
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