[1989] Proceedings of the 1st European Test Conference
Latest Publications

TOTAL DOCUMENTS

(FIVE YEARS 0)

H-INDEX

(FIVE YEARS 0)

Published By IEEE Comput. Soc. Press

0818619376

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

ATE and quality-an user's view

[1989] Proceedings of the 1st European Test Conference ◽

10.1109/etc.1989.36213 ◽

2003 ◽

Author(s):

P. Gosselin

On the definition of critical areas for IC photolithographic spot defects

[1989] Proceedings of the 1st European Test Conference ◽

10.1109/etc.1989.36237 ◽

2003 ◽

Cited By ~ 7

Author(s):

J. Pineda de Gyvez ◽

J.A.G. Jess

Keyword(s):

Critical Areas ◽

Definition Of

UTILE system: a unified environment from simulation to test

[1989] Proceedings of the 1st European Test Conference ◽

10.1109/etc.1989.36265 ◽

2003 ◽

Cited By ~ 5

Author(s):

J.-L. Becu ◽

L. Bouzaida

Keyword(s):

System A

Automatic test program generation for a block oriented VLSI chip design

[1989] Proceedings of the 1st European Test Conference ◽

10.1109/etc.1989.36222 ◽

2003 ◽

Cited By ~ 2

Author(s):

F. Hapke

Keyword(s):

Automatic Test ◽

Test Program ◽

Chip Design ◽

Program Generation ◽

Vlsi Chip

Test generation for current testing

[1989] Proceedings of the 1st European Test Conference ◽

10.1109/etc.1989.36243 ◽

2003 ◽

Cited By ~ 40

Author(s):

P. Nigh ◽

W. Maly

Keyword(s):

Test Generation ◽

Current Testing

Testing multiple power connections with boundary scan

[1989] Proceedings of the 1st European Test Conference ◽

10.1109/etc.1989.36233 ◽

2003 ◽

Cited By ~ 9

Author(s):

D. van de Lagemaat

Keyword(s):

Boundary Scan ◽

Multiple Power

Acceptance tests of distributed processing orientated supervisory control and data acquisition (SCADA) systems for offshore platforms

[1989] Proceedings of the 1st European Test Conference ◽

10.1109/etc.1989.36247 ◽

2003 ◽

Author(s):

S.K. Ray

Keyword(s):

Data Acquisition ◽

Supervisory Control ◽

Distributed Processing ◽

Offshore Platforms ◽

Scada Systems ◽

Acceptance Tests

Electrical properties and detection methods for CMOS IC defects

[1989] Proceedings of the 1st European Test Conference ◽

10.1109/etc.1989.36238 ◽

2003 ◽

Cited By ~ 101

Author(s):

J.M. Soden ◽

C.F. Hawkins

Keyword(s):

Electrical Properties ◽

Detection Methods ◽

Cmos Ic

Fault simulation for delay faults

[1989] Proceedings of the 1st European Test Conference ◽

10.1109/etc.1989.36260 ◽

2003 ◽

Cited By ~ 3

Author(s):

B.G. Oomman ◽

S.B. Akers

Keyword(s):

Fault Simulation ◽

Delay Faults

Built-in self test using perturbed deterministic patterns

[1989] Proceedings of the 1st European Test Conference ◽

10.1109/etc.1989.36269 ◽

2003 ◽

Cited By ~ 1

Author(s):

D.M. Wu ◽

J. Waicukauski

Keyword(s):

Self Test ◽

Built In Self Test

[1989] Proceedings of the 1st European Test ConferenceLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE Comput. Soc. Press

ATE and quality-an user's view

On the definition of critical areas for IC photolithographic spot defects

UTILE system: a unified environment from simulation to test

Automatic test program generation for a block oriented VLSI chip design

Test generation for current testing

Testing multiple power connections with boundary scan

Acceptance tests of distributed processing orientated supervisory control and data acquisition (SCADA) systems for offshore platforms

Electrical properties and detection methods for CMOS IC defects

Fault simulation for delay faults

Built-in self test using perturbed deterministic patterns

[1989] Proceedings of the 1st European Test Conference
Latest Publications