[1989] Proceedings of the 1st European Test Conference
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58

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Published By IEEE Comput. Soc. Press

0818619376

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

UTILE system: a unified environment from simulation to test

[1989] Proceedings of the 1st European Test Conference ◽

10.1109/etc.1989.36265 ◽

2003 ◽

Author(s):

J.-L. Becu ◽

L. Bouzaida

Keyword(s):

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Automatic test program generation for a block oriented VLSI chip design

[1989] Proceedings of the 1st European Test Conference ◽

10.1109/etc.1989.36222 ◽

2003 ◽

Author(s):

F. Hapke

Keyword(s):

Automatic Test ◽

Test Program ◽

Chip Design ◽

Program Generation ◽

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ATE and quality-an user's view

[1989] Proceedings of the 1st European Test Conference ◽

10.1109/etc.1989.36213 ◽

2003 ◽

Author(s):

P. Gosselin

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On the definition of critical areas for IC photolithographic spot defects

[1989] Proceedings of the 1st European Test Conference ◽

10.1109/etc.1989.36237 ◽

2003 ◽

Author(s):

J. Pineda de Gyvez ◽

J.A.G. Jess

Keyword(s):

Critical Areas ◽

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Acceptance tests of distributed processing orientated supervisory control and data acquisition (SCADA) systems for offshore platforms

[1989] Proceedings of the 1st European Test Conference ◽

10.1109/etc.1989.36247 ◽

2003 ◽

Author(s):

S.K. Ray

Keyword(s):

Data Acquisition ◽

Supervisory Control ◽

Distributed Processing ◽

Offshore Platforms ◽

Scada Systems ◽

Acceptance Tests

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Test generation for current testing

[1989] Proceedings of the 1st European Test Conference ◽

10.1109/etc.1989.36243 ◽

2003 ◽

Author(s):

P. Nigh ◽

W. Maly

Keyword(s):

Test Generation ◽

Current Testing

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Testing multiple power connections with boundary scan

[1989] Proceedings of the 1st European Test Conference ◽

10.1109/etc.1989.36233 ◽

2003 ◽

Author(s):

D. van de Lagemaat

Keyword(s):

Boundary Scan ◽

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Electrical properties and detection methods for CMOS IC defects

[1989] Proceedings of the 1st European Test Conference ◽

10.1109/etc.1989.36238 ◽

2003 ◽

Author(s):

J.M. Soden ◽

C.F. Hawkins

Keyword(s):

Electrical Properties ◽

Detection Methods ◽

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Fault simulation for delay faults

[1989] Proceedings of the 1st European Test Conference ◽

10.1109/etc.1989.36260 ◽

2003 ◽

Author(s):

B.G. Oomman ◽

S.B. Akers

Keyword(s):

Fault Simulation ◽

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Built-in self test using perturbed deterministic patterns

[1989] Proceedings of the 1st European Test Conference ◽

10.1109/etc.1989.36269 ◽

2003 ◽

Author(s):

D.M. Wu ◽

J. Waicukauski

Keyword(s):

Self Test ◽

Built In Self Test

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