2012 International Conference on Emerging Electronics
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9781467331364, 9781467331357
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Assessing reliability of nano-scaled CMOS technologies one defect at a time

2012 ◽  
Author(s):  
B. Kaczer ◽  
T. Grasser ◽  
J. Franco ◽  
M. Toledano Luque ◽  
P. Weckx ◽  
...  
Keyword(s):  
Scaled Cmos

scholarly journals Targeted cooling with CVD diamond and micro-channel to meet 3-D IC heat dissipation challenge

2012 ◽  
Author(s):  
Aftab Alam Khan ◽  
Shabaz Basheer Patel ◽  
Divanshu Chaturvedi ◽  
Ashudeb Dutta ◽  
Shivgovind Singh
Keyword(s):  
Heat Dissipation ◽  
Cvd Diamond ◽  
Micro Channel
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