2015 20th IEEE European Test Symposium (ETS)
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9781479976034
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

A soft-error tolerant TCAM using partial don't-care keys

2015 ◽  
Author(s):  
Infall Syafalni ◽  
Tsutomu Sasao ◽  
Xiaoqing Wen ◽  
Stefan Holst ◽  
Kohei Miyase
Keyword(s):  
Soft Error

Re-using BIST for circuit aging monitoring

2015 ◽  
Author(s):  
Farshad Firouzi ◽  
Fangming Ye ◽  
Arunkumar Vijayan ◽  
Abhishek Koneru ◽  
Krishnendu Chakrabarty ◽  
...  
Keyword(s):  
Circuit Aging

A low capture power test generation method using capture safe test vectors

2015 ◽  
Author(s):  
Atsushi Hirai ◽  
Yukari Yamauchi ◽  
Toshinori Hosokawa ◽  
Masayuki Arai
Keyword(s):  
Test Generation ◽  
Power Test ◽  
Test Vectors
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