2015 20th IEEE European Test Symposium (ETS)
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60
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9781479976034
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Robust amplitude measurement for RF BIST applications

2015 ◽  
Author(s):  
Jae Woong Jeong ◽  
Jennifer Kitchen ◽  
Sule Ozev
Keyword(s):  
Amplitude Measurement

An ECC-based memory architecture with online self-repair capabilities for reliability enhancement

2015 ◽  
Author(s):  
Gian Mayuga ◽  
Yuta Yamato ◽  
Tomokazu Yoneda ◽  
Michiko Inoue ◽  
Yasuo Sato
Keyword(s):  
Memory Architecture ◽  
Self Repair ◽  
Reliability Enhancement

A soft-error tolerant TCAM using partial don't-care keys

2015 ◽  
Author(s):  
Infall Syafalni ◽  
Tsutomu Sasao ◽  
Xiaoqing Wen ◽  
Stefan Holst ◽  
Kohei Miyase
Keyword(s):  
Soft Error

Re-using BIST for circuit aging monitoring

2015 ◽  
Author(s):  
Farshad Firouzi ◽  
Fangming Ye ◽  
Arunkumar Vijayan ◽  
Abhishek Koneru ◽  
Krishnendu Chakrabarty ◽  
...  
Keyword(s):  
Circuit Aging

A low capture power test generation method using capture safe test vectors

2015 ◽  
Author(s):  
Atsushi Hirai ◽  
Yukari Yamauchi ◽  
Toshinori Hosokawa ◽  
Masayuki Arai
Keyword(s):  
Test Generation ◽  
Power Test ◽  
Test Vectors

LSI aging estimation using ring oscillators

2015 ◽  
Author(s):  
Yukiya Miura ◽  
Tatsunori Ikeda
Keyword(s):  
Ring Oscillators

A fault tolerant response analyzer with self-error-correction capability

2015 ◽  
Author(s):  
Yuki Fukazawa ◽  
Hideyuki Ichihara ◽  
Tomoo Inoue
Keyword(s):  
Error Correction ◽  
Fault Tolerant ◽  
Error Correction Capability

Foreword

2015 ◽  
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