Journal of Scanning Probe Microscopy
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47
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Published By American Scientific Publishers

1557-7945, 1557-7937
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Adhesion Force Mapping of Raw and Treated Flax Fibres Using AFM Force-Volume

2009 ◽  
Vol 4 (2) ◽  
pp. 66-72 ◽  
Author(s):  
Gijo Raj ◽  
Eric Balnois ◽  
Christophe Baley ◽  
Yves Grohens
Keyword(s):  
Adhesion Force ◽  
Flax Fibres ◽  
Force Mapping ◽  
Force Volume

Atomic Force Microscopy Imaging of Thin Sections of Lacandonia Granules

2009 ◽  
Vol 4 (2) ◽  
pp. 73-77 ◽  
Author(s):  
R. J. Fragoso-Soriano ◽  
C. Vázquez-López ◽  
B. Pérez-García ◽  
L. F. Jiménez-García
Keyword(s):  
Atomic Force Microscopy ◽  
Microscopy Imaging ◽  
Thin Sections ◽  
Force Microscopy ◽  
Atomic Force ◽  
Atomic Force Microscopy Imaging

Scanning Tunneling Microscopic Investigations into the Conductance of Single-Atom Junctions

2009 ◽  
Vol 4 (2) ◽  
pp. 49-65 ◽  
Author(s):  
J. Kröger ◽  
A. Sperl ◽  
N. Néel ◽  
R. Berndt
Keyword(s):  
Single Atom ◽  
Scanning Tunneling ◽  
Microscopic Investigations

A New Book on Materials Characterization

2009 ◽  
Vol 4 (1) ◽  
pp. 48-48
Author(s):  
Vladimir A. Basiuk
Keyword(s):  
Materials Characterization

Study of Nanostructured In2Te3 Own Oxide

2009 ◽  
Vol 4 (1) ◽  
pp. 42-44 ◽  
Author(s):  
O. A. Balitskii ◽  
V. P. Savchyn
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