Proceedings Design, Automation and Test in Europe Conference and Exhibition
Latest Publications

TOTAL DOCUMENTS

364

(FIVE YEARS 0)

H-INDEX

(FIVE YEARS 0)

Published By IEEE Comput. Soc

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Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Defect diagnosis and silicon debug: the continuing detective story [Tutorial]

Proceedings Design, Automation and Test in Europe Conference and Exhibition ◽

10.1109/date.2004.1268812 ◽

2005 ◽

Author(s):

D. Gizopoulos ◽

S. Venkataraman ◽

R. Aitken

Keyword(s):

Detective Story ◽

Defect Diagnosis ◽

Silicon Debug

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RTL power optimisation: concepts, tools and design experiences [Tutorial]

Proceedings Design, Automation and Test in Europe Conference and Exhibition ◽

10.1109/date.2004.1268816 ◽

2005 ◽

Author(s):

M. Poncino ◽

P. Sithambaram ◽

R. Zafalon

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Constraint and integer programming techniques and tools for digital system design [Tutorial]

Proceedings Design, Automation and Test in Europe Conference and Exhibition ◽

10.1109/date.2004.1268815 ◽

2005 ◽

Author(s):

M. Milano ◽

K. Kuchkinski ◽

J. Puget

Keyword(s):

Integer Programming ◽

System Design ◽

Digital System ◽

Programming Techniques ◽

Digital System Design

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Validating sat solvers using an independent resolution-based checker: practical implementations and other applications [Award]

Proceedings Design, Automation and Test in Europe Conference and Exhibition ◽

10.1109/date.2004.1270516 ◽

2005 ◽

Author(s):

Lintao Zhang ◽

S. Malik

Keyword(s):

Sat Solvers

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The coming of age of reconfigurable computing-potentials and challenges of a new technology [Tutorial]

Proceedings Design, Automation and Test in Europe Conference and Exhibition ◽

10.1109/date.2004.1268810 ◽

2005 ◽

Author(s):

W. Najjar ◽

F. Kurdahi ◽

K. Vissers

Keyword(s):

Reconfigurable Computing ◽

Coming Of Age ◽

New Technology

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Programming models for multiprocessor SoC (full-day) [Tutorial]

Proceedings Design, Automation and Test in Europe Conference and Exhibition ◽

10.1109/date.2004.1268809 ◽

2005 ◽

Author(s):

A. Jerraya ◽

F. Pospiech ◽

R. Ernst ◽

G. Desoli

Keyword(s):

Programming Models ◽

Multiprocessor Soc ◽

Full Day

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Reliable design: a system perspective [Tutorial]

Proceedings Design, Automation and Test in Europe Conference and Exhibition ◽

10.1109/date.2004.1268811 ◽

2005 ◽

Author(s):

G. De Micheli ◽

R. Iyer

Keyword(s):

System Perspective ◽

Reliable Design

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Advanced domino circuit design [Tutorial]

Proceedings Design, Automation and Test in Europe Conference and Exhibition ◽

10.1109/date.2004.1268814 ◽

2005 ◽

Cited By ~ 1

Author(s):

D. Harris ◽

T. Grutkowski

Keyword(s):

Circuit Design ◽

Domino Circuit

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Delay defect diagnosis based upon statistical timing models - the first step [Award]

Proceedings Design, Automation and Test in Europe Conference and Exhibition ◽

10.1109/date.2004.1270517 ◽

2005 ◽

Author(s):

A. Krstic ◽

Li.-C. Wang ◽

Kwang-Ting Cheng ◽

Jing-Jia Liou ◽

M.S. Abadir

Keyword(s):

Defect Diagnosis ◽

Statistical Timing ◽

Timing Models

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DF for low cost testers [Tutorial]

Proceedings Design, Automation and Test in Europe Conference and Exhibition ◽

10.1109/date.2004.1268806 ◽

2005 ◽

Author(s):

D. Gizopoulos ◽

G. Eide ◽

A. Crouch ◽

K. Posse

Keyword(s):

Low Cost

Download Full-text

Proceedings Design, Automation and Test in Europe Conference and ExhibitionLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE Comput. Soc

Defect diagnosis and silicon debug: the continuing detective story [Tutorial]

RTL power optimisation: concepts, tools and design experiences [Tutorial]

Constraint and integer programming techniques and tools for digital system design [Tutorial]

Validating sat solvers using an independent resolution-based checker: practical implementations and other applications [Award]

The coming of age of reconfigurable computing-potentials and challenges of a new technology [Tutorial]

Programming models for multiprocessor SoC (full-day) [Tutorial]

Reliable design: a system perspective [Tutorial]

Advanced domino circuit design [Tutorial]

Delay defect diagnosis based upon statistical timing models - the first step [Award]

DF for low cost testers [Tutorial]

Proceedings Design, Automation and Test in Europe Conference and Exhibition
Latest Publications