Fifth Size Strain Conference. Diffraction Analysis of the Microstructure of Materials
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Published By OLDENBOURG WISSENSCHAFTSVERLAG

9783486992564

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Frontmatter

Fifth Size Strain Conference. Diffraction Analysis of the Microstructure of Materials ◽

10.1524/9783486992564-fm ◽

2008 ◽

pp. I-VI

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Influence of reactive plasmas on thin nickel films

Fifth Size Strain Conference. Diffraction Analysis of the Microstructure of Materials ◽

10.1524/9783486992564-036 ◽

2008 ◽

pp. 295-302

Keyword(s):

Nickel Films ◽

Thin Nickel

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Profiling of fibre texture gradients in thin films by anomalous X-ray diffraction

Fifth Size Strain Conference. Diffraction Analysis of the Microstructure of Materials ◽

10.1524/9783486992564-033 ◽

2008 ◽

pp. 263-272

Keyword(s):

Thin Films ◽

X Ray Diffraction ◽

X Ray ◽

Fibre Texture

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In-situ X-ray diffraction investigations of thin films: Determination of thermoelastic constants

Fifth Size Strain Conference. Diffraction Analysis of the Microstructure of Materials ◽

10.1524/9783486992564-032 ◽

2008 ◽

pp. 253-260

Keyword(s):

Thin Films ◽

X Ray Diffraction ◽

X Ray

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Determination of stored elastic energy in plastically deformed copper

Fifth Size Strain Conference. Diffraction Analysis of the Microstructure of Materials ◽

10.1524/9783486992564-009 ◽

2008 ◽

pp. 65-72

Keyword(s):

Elastic Energy ◽

Stored Elastic Energy

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Optimisation of coherent X-ray diffraction imaging at ultrabright synchrotron sources

Fifth Size Strain Conference. Diffraction Analysis of the Microstructure of Materials ◽

10.1524/9783486992564-005 ◽

2008 ◽

pp. 27-36

Keyword(s):

X Ray Diffraction ◽

X Ray ◽

Diffraction Imaging

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Diffraction analysis of layer disorder

Fifth Size Strain Conference. Diffraction Analysis of the Microstructure of Materials ◽

10.1524/9783486992564-002 ◽

2008 ◽

pp. 3-4

Keyword(s):

Diffraction Analysis ◽

Layer Disorder

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The “state of the art” of the diffraction analysis of crystallite size and lattice strain

Fifth Size Strain Conference. Diffraction Analysis of the Microstructure of Materials ◽

10.1524/9783486992564-013 ◽

2008 ◽

pp. 99-100

Keyword(s):

Diffraction Analysis ◽

Crystallite Size ◽

Lattice Strain ◽

State Of The Art ◽

The State

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Fifth Size Strain Conference. Diffraction Analysis of the Microstructure of Materials ◽

10.1524/9783486992564-toc ◽

2008 ◽

pp. IX-XII

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Magnetron deposited TiO2 thin films – crystallization and temperature dependence of microstructure and phase composition

Fifth Size Strain Conference. Diffraction Analysis of the Microstructure of Materials ◽

10.1524/9783486992564-035 ◽

2008 ◽

pp. 287-294

Keyword(s):

Thin Films ◽

Phase Composition ◽

Temperature Dependence ◽

Tio2 Thin Films

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Fifth Size Strain Conference. Diffraction Analysis of the Microstructure of Materials
Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By OLDENBOURG WISSENSCHAFTSVERLAG

Frontmatter

Influence of reactive plasmas on thin nickel films

Profiling of fibre texture gradients in thin films by anomalous X-ray diffraction

In-situ X-ray diffraction investigations of thin films: Determination of thermoelastic constants

Determination of stored elastic energy in plastically deformed copper

Optimisation of coherent X-ray diffraction imaging at ultrabright synchrotron sources

Diffraction analysis of layer disorder

The “state of the art” of the diffraction analysis of crystallite size and lattice strain

Table of Contents

Magnetron deposited TiO2 thin films – crystallization and temperature dependence of microstructure and phase composition

Export Citation Format

Fifth Size Strain Conference. Diffraction Analysis of the Microstructure of MaterialsLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By OLDENBOURG WISSENSCHAFTSVERLAG

Frontmatter

Influence of reactive plasmas on thin nickel films

Profiling of fibre texture gradients in thin films by anomalous X-ray diffraction

In-situ X-ray diffraction investigations of thin films: Determination of thermoelastic constants

Determination of stored elastic energy in plastically deformed copper

Optimisation of coherent X-ray diffraction imaging at ultrabright synchrotron sources

Diffraction analysis of layer disorder

The “state of the art” of the diffraction analysis of crystallite size and lattice strain

Table of Contents

Magnetron deposited TiO2 thin films – crystallization and temperature dependence of microstructure and phase composition

Fifth Size Strain Conference. Diffraction Analysis of the Microstructure of Materials
Latest Publications